MCU 32KB FLASH EEPROM 32-VFQFPN

STM8S105K6U6

Manufacturer Part NumberSTM8S105K6U6
DescriptionMCU 32KB FLASH EEPROM 32-VFQFPN
ManufacturerSTMicroelectronics
SeriesSTM8S
STM8S105K6U6 datasheet
 


Specifications of STM8S105K6U6

Core ProcessorSTM8Core Size8-Bit
Speed16MHzConnectivityI²C, IrDA, LIN, SPI, UART/USART
PeripheralsBrown-out Detect/Reset, POR, PWM, WDTNumber Of I /o25
Program Memory Size32KB (32K x 8)Program Memory TypeFLASH
Eeprom Size1K x 8Ram Size2K x 8
Voltage - Supply (vcc/vdd)2.95 V ~ 5.5 VData ConvertersA/D 7x10b
Oscillator TypeInternalOperating Temperature-40°C ~ 85°C
Package / Case32-VFQFN, 32-VFQFPNProcessor SeriesSTM8S10x
CoreSTM8Data Bus Width8 bit
Data Ram Size2 KBInterface TypeI2C, SPI, UART
Maximum Clock Frequency16 MHzNumber Of Programmable I/os25
Number Of Timers8Maximum Operating Temperature+ 85 C
Mounting StyleSMD/SMT3rd Party Development ToolsEWSTM8
Development Tools By SupplierSTICE-SYS001Minimum Operating Temperature- 40 C
On-chip Adc10 bit, 7 ChannelFor Use With497-10040 - EVAL KIT STM8S DISCOVERY497-10593 - KIT STARTER FOR STM8S207/8 SER
Lead Free Status / RoHS StatusLead free / RoHS CompliantOther names497-10123
STM8S105K6U6
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STM8S105xx
10.3.12.5
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied
to the pins of each sample according to each pin combination. The sample size depends on
the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Symbol
Ratings
V
Electrostatic discharge
ESD(HBM)
voltage (Human body model)
V
Electrostatic discharge
ESD(CDM)
voltage (Charge device
model)
(1)
Data based on characterization results, not tested in production
10.3.12.6
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up performance:
A supply overvoltage (applied to each power supply pin)
A current injection (applied to each input, output and configurable I/O pin) are performed
on each sample.
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Symbol
Parameter
LU
Static latch-up class
(1)
Class description: A Class is an STMicroelectronics internal specification. All its limits
are higher than the JEDEC specifications, that means when a device belongs to class A it
exceeds the JEDEC standard. B class strictly covers all the JEDEC criteria (international
standard).
Table 50: ESD absolute maximum ratings
Conditions
T
= +25°C,
A
conforming to
JESD22-A114
T
=+25°C, conforming
A
to JESD22-C101
Table 51: Electrical sensitivities
Conditions
T
= +25 °C
A
T
= +85 °C
A
T
= +125 °C
A
DocID14771 Rev 10
Electrical characteristics
Class
Maximum
Unit
(1)
value
A
2000
V
IV
1000
V
(1)
Class
A
A
A
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