MC9S12D64MFUE Freescale Semiconductor, MC9S12D64MFUE Datasheet - Page 103

IC MCU 64K FLASH 25MHZ 80-QFP

MC9S12D64MFUE

Manufacturer Part Number
MC9S12D64MFUE
Description
IC MCU 64K FLASH 25MHZ 80-QFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of MC9S12D64MFUE

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
CAN, I²C, SCI, SPI
Peripherals
PWM, WDT
Number Of I /o
59
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 5.25 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
80-QFP
Processor Series
S12D
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
4 KB
Interface Type
CAN/I2C/SCI/SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
49
Number Of Timers
8
Operating Supply Voltage
4.5 V to 5.25 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Development Tools By Supplier
M68KIT912DP256
Minimum Operating Temperature
- 40 C
On-chip Adc
2 (8-ch x 10-bit)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MC9S12D64MFUE
Manufacturer:
FREESCALE
Quantity:
2 650
Part Number:
MC9S12D64MFUE
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
MC9S12D64MFUE
Manufacturer:
FREESCALE
Quantity:
2 650
Company:
Part Number:
MC9S12D64MFUE
Quantity:
48
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Conditions are shown in Table A-4 unless otherwise noted
Num C
NOTES:
1. Total time at the maximum guaranteed device operating temperature <= 1 year
1
2
3
4
C
C Flash number of Program/Erase cycles
C
C
Data Retention at an average junction temperature of
T
EEPROM number of Program/Erase cycles
(–40 C
EEPROM number of Program/Erase cycles
(0 C < T
Javg
= 85 C
J
T
J
140 C)
1
0 C)
Table A-12 NVM Reliability Characteristics
Rating
Symbol
t
NVMRET
n
n
n
EEPE
EEPE
FLPE
MC9S12DJ64 Device User Guide — V01.20
100,000
10,000
10,000
Min
15
Typ
Max
Cycles
Cycles
Cycles
Years
Unit
103

Related parts for MC9S12D64MFUE