STM32F101R6T6A STMicroelectronics, STM32F101R6T6A Datasheet - Page 51

MCU ARM 32BIT 32KB FLASH 64LQFP

STM32F101R6T6A

Manufacturer Part Number
STM32F101R6T6A
Description
MCU ARM 32BIT 32KB FLASH 64LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F101R6T6A

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
36MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
DMA, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
51
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
6K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LQFP
Processor Series
STM32F101x
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
6 KB
Interface Type
I2C, SPI, USART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
51
Number Of Timers
2
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWARM, EWARM-BL, MDK-ARM, RL-ARM, ULINK2
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit, 16 Channel
Featured Product
STM32 Cortex-M3 Companion Products
Eeprom Size
-
A/d Bit Size
12 bit
A/d Channels Available
16
Height
1.4 mm
Length
10 mm
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2 V
Width
10 mm
For Use With
497-10030 - STARTER KIT FOR STM32KSDKSTM32-PL - KIT IAR KICKSTART STM32 CORTEXM3497-8512 - KIT STARTER FOR STM32F10XE MCU497-8505 - KIT STARTER FOR STM32F10XE MCU497-6438 - BOARD EVALUTION FOR STM32 512K497-6289 - KIT PERFORMANCE STICK FOR STM32MCBSTM32UME - BOARD EVAL MCBSTM32 + ULINK-MEMCBSTM32U - BOARD EVAL MCBSTM32 + ULINK2497-6053 - KIT STARTER FOR STM32497-6052 - KIT STARTER FOR STM32497-6050 - KIT STARTER FOR STM32497-6049 - KIT EVALUATION LOW COST STM32497-6048 - BOARD EVALUATION FOR STM32497-6047 - KIT DEVELOPMENT FOR STM32
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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STM32F101x4, STM32F101x6
5.3.12
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in
Table 33.
I
INJ
Symbol
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
I/O current injection susceptibility
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
Injected current on all FT pins
Injected current on any other pin
Description
Table 33
Doc ID 15058 Rev 5
Functional susceptibility
Negative
injection
-5
-0
-5
Electrical characteristics
injection
Positive
+0
+0
+5
SS
Unit
mA
or
51/79

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