MCU ARM9 2048KB FLASH 128LQFP

 

STR912FAW47X6T

Manufacturer Part NumberSTR912FAW47X6T
DescriptionMCU ARM9 2048KB FLASH 128LQFP
ManufacturerSTMicroelectronics
SeriesSTR9
STR912FAW47X6T datasheets

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Warranty: 60 days

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Specifications of STR912FAW47X6T

Core ProcessorARM9Core Size32-Bit
Speed96MHzConnectivityCAN, EBI/EMI, Ethernet, I²C, IrDA, Microwire, SPI, SSI, SSP, UART/USART, USB
PeripheralsBrown-out Detect/Reset, DMA, Motor Control PWM, POR, PWM, WDTNumber Of I /o80
Program Memory Size2MB (2M x 8)Program Memory TypeFLASH
Ram Size96K x 8Voltage - Supply (vcc/vdd)1.65 V ~ 2 V
Data ConvertersA/D 8x10bOscillator TypeInternal
Operating Temperature-40°C ~ 85°CPackage / Case128-LQFP
Processor SeriesSTR912xCoreARM966E-S
Data Bus Width16 bit, 32 bitData Ram Size96 KB
Interface TypeCAN, I2C, IrDA, SSP, UART, USBMaximum Clock Frequency96 MHz
Number Of Programmable I/os80Number Of Timers4
Maximum Operating Temperature+ 85 CMounting StyleSMD/SMT
3rd Party Development ToolsEWARM, EWARM-BL, MCBSTR9, MCBSTR9U, MCBSTR9UME, KSDK-STR912-PLUS, MDK-ARM, RL-ARM, ULINK2Minimum Operating Temperature- 40 C
On-chip Adc10 bit, 8 ChannelFor Use WithMCBSTR9UME - BOARD EVAL MCBSTR9 + ULINK-MEMCBSTR9U - BOARD EVAL MCBSTR9 + ULINK2MCBSTR9 - BOARD EVAL STM STR9 SERIES
Lead Free Status / RoHS StatusLead free / RoHS CompliantEeprom Size-
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Page 91/102

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STR91xFAxxx
Table 48.
ADC conversion time (silicon Rev G)
Symbol
Parameter
t
Single mode conversion time
CONV(S]
TR(S)
Single mode throughput rate
t
Continuous mode conversion time
CONV(C]
TR(C)
Continuous mode throughput rate
1. Guaranteed by design, not tested in production.
2. Parameters in this table apply to devices with silicon Rev G. Refer to
and to
Section 8: Device
marking.
3. Value obtained on conversions started by trigger in single mode
4. All sucessive conversions in continuous and scan modes.
Table 49.
ADC conversion time (silicon Rev H and higher)
Symbol
Parameter
t
Single mode conversion time
CONV(S]
TR(S)
Single mode throughput rate
t
Continuous mode conversion time
CONV(C]
TR(C)
Continuous mode throughput rate
t
Fast trigger mode conversion time
CONV(FT]
TR(FT)
Fast trigger mode throughput rate
1. Guaranteed by design, not tested in production.
2. Parameters in this table apply to devices with silicon Rev H and higher. Refer to
memory and to
Section 8: Device
3. Value obtained from conversions started by trigger in single mode
4. All successive conversions in continuous and scan modes.
5. Conversion started by trigger when automatic clock gated mode enabled. Fast trigger mode is available only in devices with
silicon Rev H and higher.
6. Value obtained from conversions started by fast trigger in single mode
Test
(1) (2)
conditions
f
= 24 MHz
ADC
(3)
f
= 24 MHz
ADC
(4)
f
= 24 MHz
ADC
f
= 24 MHz
ADC
Table 5
Test
(1) (2)
conditions
f
= 24 MHz
ADC
(3)
f
= 24 MHz
ADC
(4)
f
= 24 MHz
ADC
f
= 24 MHz
ADC
(5)
f
= 24 MHz
ADC
(6)
f
= 24 MHz
ADC
marking.
Doc ID 13495 Rev 6
Electrical characteristics
Value
Min
Typ
Max
2*16/f
3*16/f
ADC
ADC
1.33
2
500
1*16/f
ADC
0.66
1500
for device rev identification in OTP memory
Value
Min
Typ
Max
1*16/f
2*16/f
ADC
ADC
0.66
1.33
750
1*16/f
ADC
0.66
1500
1*16/f
ADC
0.66
100
1200
Table 5
for device rev identification in OTP
Unit
µs
ksps
µs
µs
ksps
Unit
µs
ksps
µs
µs
ksps
µs
µs
ksps
91/102

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