MC9S08GT60CFD Freescale Semiconductor, MC9S08GT60CFD Datasheet - Page 272

• Manufacturer Part Number: MC9S08GT60CFD
• Description: MCU 8BIT 60K FLASH 48-QFN
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08GT60CFD

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 39
• Program Memory Size: 60KB (60K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-QFN Exposed Pad
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

Appendix A Electrical Characteristics
272
1
2
3
4
5
6
7
8
Output clock ICGOUT frequency
Minimum DCO clock (ICGDCLK) frequency
Maximum DCO clock (ICGDCLK) frequency
Self-clock mode (ICGOUT) frequency
Self-clock mode reset (ICGOUT) frequency
Loss of reference frequency
Loss of DCO frequency
Crystal start-up time
FLL lock time
FLL frequency unlock range
FLL frequency lock range
ICGOUT period jitter,
Internal oscillator deviation from trimmed frequency
Self-clocked mode frequency is the frequency that the DCO generates when the FLL is open-loop.
Loss of reference frequency is the reference frequency detected internally, which transitions the ICG into self-clocked
mode if it is not in the desired range.
Loss of DCO frequency is the DCO frequency detected internally, which transitions the ICG into FLL bypassed external
mode (if an external reference exists) if it is not in the desired range.
This parameter is characterized before qualification rather than 100% tested.
Proper PC board layout procedures must be followed to achieve specifications.
This specification applies to the period of time required for the FLL to lock after entering FLL engaged internal or external
modes. If a crystal/resonator is being used as the reference, this specification assumes it is already running.
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
percentage for a given interval.
See
CLKS = 10, REFS = 0
All other cases
Low range
High range
Low range
High range
Low range
High range
Long term jitter (averaged over 2 ms interval)
V
V
DD
DD
Figure A-10
= 1.8 – 3.6 V, (constant temperature)
= 3.0 V ±10%, –40° C to 85° C
4, 6
(V
DDA
Characteristic
4, 5
4, 7
= V
3
measured at f
DDA
2
Table A-9. ICG Frequency Specifications (continued)
(min) to V
DDA
1
ICGOUT
and V
MC9S08GB/GT Data Sheet, Rev. 2.3
DDA
Max
SSA
(max), Temperature Range = –40 to 85°C Ambient)
and variation in crystal oscillator frequency increase the C
8
f
f
ICGDCLKmax
ICGDCLKmin
f
Symbol
f
Self_reset
n
ACC
ICGOUT
t
t
C
t
n
t
CSTH
f
f
CSTL
Lockh
Unlock
f
Lockl
LOR
LOD
Self
Lock
Jitter
int
f
f
ICGDCLKmin
Extal
f
lo
–4*N
–2*N
Min
5.5
0.5
(min)
50
—
—
—
—
—
—
—
8
5
(min)
Typical
± 0.5
±0.5
430
—
—
8
4
Freescale Semiconductor
f
f
f
ICGDCLKmax
ICGDCLKmax
Extal
(max)
Max
10.5
500
4*N
2*N
1.5
0.2
40
25
±2
±2
—
—
2
2
(max)
Jitter
counts
counts
% f
ICGOUT
MHz
MHz
MHz
MHz
MHz
MHz
Unit
kHz
ms
ms
%
ICG
.