TDA5230 Infineon Technologies, TDA5230 Datasheet - Page 178

• Manufacturer Part Number: TDA5230
• Description: IC RECEIVER ASK/FSK 28-TSSOP
• Manufacturer: Infineon Technologies
• Type: Receiverr

Specifications of TDA5230

• Package / Case: 28-TSSOP
• Frequency: 433MHz ~ 450MHz, 865MHz ~ 868MHz
• Sensitivity: -111dBm
• Data Rate - Maximum: 20 kbps
• Modulation Or Protocol: ASK, FSK
• Applications: RKE, TPM, Security Systems
• Current - Receiving: 8mA
• Data Interface: PCB, Surface Mount
• Antenna Connector: PCB, Surface Mount
• Voltage - Supply: 3 V ~ 3.6 V, 4.5 V ~ 5.5 V
• Operating Temperature: -40°C ~ 105°C
• Operating Frequency: 870 MHz
• Operating Supply Voltage: 3.3 V, 5 V
• Maximum Operating Temperature: + 105 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Memory Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: SP000076520; TDA5230; TDA5230INTR

Table 11
The following Specification values are evaluated for FSK 2kbit. Acceptance Criteria is: MER < 10 %
* not subject to production test - verified by characterization/design
Table 12
* not subject to production test - verified by characterization/design
Data Sheet
L.1 Sensitivity Limit
M.
1
#
#
Sensitivity Limit FSK-Mode
868.3 MHz, Matching to 868.3 MHz,
XTAL=13.4 MHz
Data Rate 2 kbit/s, deviation
Data Rate 2 kbit/s, deviation
Data Rate 9.6 kbit/s, deviation
Data Rate 20 kbit/s, deviation
TDA5230
868.3 MHz, Matching to 868.3 MHz,
XTAL=13.4 MHz
ASK Sensitivity of Receiver in other Frequency Bands
FSK Sensitivity of Receiver in other Frequency Bands
Parameter
Parameter
D
D
D
D
±
±
35 kHz
±
10 kHz
±
50 kHz
35 kHz
S868FSK1
S868FSK2
S868FSK3
S868FSK4
Symbol
S868ASK
Symbol
174
min. typ. max.
Limit Values
min.
-108 -103 dBm
Limit Values
-100
-108
-103.5
-102
typ.
-95
-103
-98.5
-97
max.
Unit
Version 4.0, 2007-06-01
peak
dBm
dBm
dBm
dBm
Unit
DRE 0% & DC 50%
Specifications
Test Case
TDA523x
DRE 0%
& DC
50%
Case
Test
*
*
*
*