FPGA - Field Programmable Gate Array 125K System Gates ProASIC3 nano

A3PN125-ZVQG100

Manufacturer Part NumberA3PN125-ZVQG100
DescriptionFPGA - Field Programmable Gate Array 125K System Gates ProASIC3 nano
ManufacturerActel
A3PN125-ZVQG100 datasheet
 

Specifications of A3PN125-ZVQG100

Processor SeriesA3PN125CoreIP Core
Number Of Macrocells1024Maximum Operating Frequency350 MHz
Number Of Programmable I/os71Data Ram Size36 Kbit
Delay Time1.02 nsSupply Voltage (max)3.3 V
Supply Current2 mAMaximum Operating Temperature+ 70 C
Minimum Operating Temperature- 20 CDevelopment Tools By SupplierAGLN-Nano-Kit, AGLN-Z-Nano-Kit, Silicon-Explorer II, Silicon-Sculptor 3, SI-EX-TCA, FloasPro 4, FlashPro 3, FlashPro Lite
Mounting StyleSMD/SMTSupply Voltage (min)1.5 V
Number Of Gates125 KPackage / CaseVQFP-100
Lead Free Status / RoHS StatusLead free / RoHS Compliant  
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
Page 31
32
Page 32
33
Page 33
34
Page 34
35
Page 35
36
Page 36
37
Page 37
38
Page 38
39
Page 39
40
Page 40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
Page 34/106

Download datasheet (4Mb)Embed
PrevNext
ProASIC3 nano DC and Switching Characteristics
Table 2-23 • I/O Short Currents I
3.3 V LVTTL / 3.3 V LVCMOS
3.3 V LVCMOS Wide Range
2.5 V LVCMOS
1.8 V LVCMOS
1.5 V LVCMOS
Note:
*T
= 100°C
J
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 8 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 100°C, the short current condition would have to be sustained for more than six months
to cause a reliability concern. The I/O design does not contain any short circuit protection, but such
protection would only be needed in extremely prolonged stress conditions.
Table 2-24 • Duration of Short Circuit Event before Failure
Temperature
–40°C
–20°C
0°C
25°C
70°C
85°C
100°C
2- 20
/I
OSH
OSL
Drive Strength
I
OSL
2 mA
4 mA
6 mA
8 mA
100 µA
Same as equivalent software
2 mA
4 mA
6 mA
8 mA
2 mA
4 mA
2 mA
/I
events depends on the junction temperature. The
OSH
OSL
Time before Failure
> 20 years
> 20 years
> 20 years
> 20 years
5 years
2 years
6 months
R e visio n 8
(mA)*
I
(mA)*
OSH
25
27
25
27
51
54
51
54
default drive
16
18
16
18
32
37
32
37
9
11
17
22
13
16