A3PN125-ZVQG100 Actel, A3PN125-ZVQG100 Datasheet - Page 84

FPGA - Field Programmable Gate Array 125K System Gates ProASIC3 nano

A3PN125-ZVQG100

Manufacturer Part Number
A3PN125-ZVQG100
Description
FPGA - Field Programmable Gate Array 125K System Gates ProASIC3 nano
Manufacturer
Actel
Datasheet

Specifications of A3PN125-ZVQG100

Processor Series
A3PN125
Core
IP Core
Number Of Macrocells
1024
Maximum Operating Frequency
350 MHz
Number Of Programmable I/os
71
Data Ram Size
36 Kbit
Delay Time
1.02 ns
Supply Voltage (max)
3.3 V
Supply Current
2 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
- 20 C
Development Tools By Supplier
AGLN-Nano-Kit, AGLN-Z-Nano-Kit, Silicon-Explorer II, Silicon-Sculptor 3, SI-EX-TCA, FloasPro 4, FlashPro 3, FlashPro Lite
Mounting Style
SMD/SMT
Supply Voltage (min)
1.5 V
Number Of Gates
125 K
Package / Case
VQFP-100
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
A3PN125-ZVQG100
Manufacturer:
Microsemi SoC
Quantity:
10 000
Part Number:
A3PN125-ZVQG100I
Manufacturer:
Microsemi SoC
Quantity:
10 000
ProASIC3 nano DC and Switching Characteristics
JTAG 1532 Characteristics
Actel Safety Critical, Life Support, and High-Reliability
Applications Policy
2- 70
JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to
the corresponding standard selected; refer to the I/O timing characteristics in the
Characteristics" section on page 2-12
Timing Characteristics
Table 2-78 • JTAG 1532
The Actel products described in this advance status datasheet may not have completed Actel’s
qualification process. Actel may amend or enhance products during the product introduction and
qualification process, resulting in changes in device functionality or performance. It is the responsibility of
each customer to ensure the fitness of any Actel product (but especially a new product) for a particular
purpose, including appropriateness for safety-critical, life-support, and other high-reliability applications.
Consult Actel’s Terms and Conditions for specific liability exclusions relating to life-support applications.
A reliability report covering all of Actel’s products is available on the Actel website at
http://www.actel.com/documents/ORT_Report.pdf. Actel also offers a variety of enhanced qualification
and lot acceptance screening procedures. Contact your local Actel sales office for additional reliability
information.
Parameter
t
t
t
t
t
t
F
t
t
t
Note:
DISU
DIHD
TMSSU
TMDHD
TCK2Q
RSTB2Q
TRSTREM
TRSTREC
TRSTMPW
TCKMAX
For specific junction temperature and voltage supply levels, refer to
derating values.
Commercial-Case Conditions: T
Test Data Input Setup Time
Test Data Input Hold Time
Test Mode Select Setup Time
Test Mode Select Hold Time
Clock to Q (data out)
Reset to Q (data out)
TCK Maximum Frequency
ResetB Removal Time
ResetB Recovery Time
ResetB Minimum Pulse
Description
for more details.
R e visio n 8
J
= 70°C, Worst-Case VCC = 1.425 V
21.31
23.00
TBD
0.53
1.07
0.53
1.07
6.39
0.00
0.21
–2
Table 2-6 on page 2-5
24.15
20.00
0.60
1.21
0.60
1.21
7.24
0.00
0.24
TBD
–1
28.41
17.00
8.52
0.00
0.28
TBD
Std.
0.71
1.42
0.71
1.42
"User I/O
Units
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
for

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