OP470GS Analog Devices Inc, OP470GS Datasheet - Page 11

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OP470GS

Manufacturer Part Number
OP470GS
Description
Operational Amplifier (Op-Amp) IC
Manufacturer
Analog Devices Inc
Type
General Purpose Amplifierr
Datasheet

Specifications of OP470GS

No. Of Amplifiers
4
Bandwidth
6MHz
Slew Rate
2V/µs
No. Of Pins
16
Operating Temperature Range
-40°C To +85°C
Peak Reflow Compatible (260 C)
No
Leaded Process Compatible
No
Rohs Status
RoHS non-compliant
Amplifier Type
General Purpose
Number Of Circuits
4
Gain Bandwidth Product
6MHz
Current - Input Bias
25nA
Voltage - Input Offset
400µV
Current - Supply
9mA
Voltage - Supply, Single/dual (±)
9 V ~ 36 V, ±4.5 V ~ 18 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
16-SOIC (0.300", 7.5mm Width)
Rail/rail I/o Type
No
Number Of Elements
4
Unity Gain Bandwidth Product
6MHz
Common Mode Rejection Ratio
100dB
Input Offset Voltage
1mV
Input Bias Current
60nA
Single Supply Voltage (typ)
Not RequiredV
Dual Supply Voltage (typ)
±5/±9/±12/±15V
Voltage Gain In Db
124.61dB
Power Supply Rejection Ratio
120dB
Power Supply Requirement
Dual
Shut Down Feature
No
Single Supply Voltage (min)
Not RequiredV
Single Supply Voltage (max)
Not RequiredV
Dual Supply Voltage (min)
±4.5V
Dual Supply Voltage (max)
±18V
Technology
Bipolar
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
16
Package Type
SOIC W
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Output Type
-
Current - Output / Channel
-
-3db Bandwidth
-
Lead Free Status / Rohs Status
Not Compliant

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0
4. The test time to measure 0.1 Hz to 10 Hz noise should not ex-
5. A noise-voltage-density test is recommended when measuring
6. Power should be supplied to the test circuit by well bypassed
Figure 8. 0.1 Hz to 10 Hz Peak-to-Peak Voltage Noise Test
Circuit Frequency Response
NOISE MEASUREMENT—NOISE VOLTAGE DENSITY
The circuit of Figure 9 shows a quick and reliable method of
measuring the noise voltage density of quad op amps. Each
individual amplifier is series-connected and is in unity-gain, save
the final amplifier which is in a noninverting gain of 101. Since
the ac noise voltages of each amplifier are uncorrelated, they
add in rms fashion to yield:
REV. B
ceed 10 seconds. As shown in the noise-tester frequency-response
curve of Figure 8, the 0.1 Hz corner is defined by only one pole.
The test time of 10 seconds acts as an additional pole to elimi-
nate noise contribution from the frequency band below 0.1 Hz.
noise on a large number of units. A 10 Hz noise voltage-density
measurement will correlate well with a 0.1 Hz to 10 Hz
peak-to-peak noise reading, since both results are determined
by the white noise and the location of the 1/f corner frequency.
low noise supplies, e.g. batteries. These will minimize output
noise introduced via the amplifier supply pins.
100
80
60
40
20
0
0.01
e
OUT
= 101
0.1
Ê
Ë
e
FREQUENCY – Hz
nA
2
1/4
OP470
+ e
1
nB
2
+
e
nC
Figure 9. Noise Voltage Density Test Circuit
2
10
+
1/4
OP470
e
nD
2
ˆ
¯
100
1/4
OP470
–11–
100
The OP470 is a monolithic device with four identical amplifiers.
The noise voltage density of each individual amplifier will match,
giving:
NOISE MEASUREMENT—CURRENT NOISE DENSITY
The test circuit shown in Figure 10 can be used to measure
current noise density. The formula relating the voltage output to
current noise density is:
where:
R1
R1
5
e
V
OUT
S
=
Figure 10. Current Noise Density Test Circuit
(nV Hz) = 101(2e
15V
100k
1/4
OP470
R2
10k
R2
e
OUT
i
G = gain of 10000
R
n
S
=
OP470
DUT
= 100 kW source resistance
TO SPECTRUM ANALYZER
1.24k
=
n
R3
Ê
Á
Ë
)
101
nOUT
200
G
e
R4
OUT
Ê
Ë
ˆ
˜ -
¯
4e
2
n
OP27E
R
2
(
40nV / Hz
S
ˆ
¯
8.06k
= 101 2e
R5
GAIN = 50,000
V
S
=
5V
( )
)
e
SPECTRUM ANALYZER
2
n
n
OP470
OUT TO

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