STM32F101VFT6 STMicroelectronics, STM32F101VFT6 Datasheet - Page 95

MCU 32BIT 768KB FLASH 100LQFP

STM32F101VFT6

Manufacturer Part Number
STM32F101VFT6
Description
MCU 32BIT 768KB FLASH 100LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F101VFT6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
36MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
DMA, LCD, POR, PWM, WDT
Number Of I /o
80
Program Memory Size
768KB (768K x 8)
Program Memory Type
FLASH
Ram Size
80K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Processor Series
STM32F101xF
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
80 KB
Interface Type
I2C, SPI, UART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
112
Number Of Timers
15
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Operating Temperature Range
- 40 C to + 105 C
Processor To Be Evaluated
STM32F101VF
Supply Current (max)
28 mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-11113

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0
STM32F101xF, STM32F101xG
Table 58.
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V
3. ADC accuracy vs. negative injection current: Injecting negative current on any of the standard (non-robust)
4. Preliminary values.
Figure 49. ADC accuracy characteristics
Symbol
4095
4094
4093
analog input pins should be avoided as this significantly reduces the accuracy of the conversion being
performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to standard
analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for I
affect the ADC accuracy.
EO
EG
ED
ET
EL
7
6
5
4
3
2
1
0
V
SSA
[1LSB
1
E
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
IDEAL
O
ADC accuracy
2
=
V
4096
3
REF+
Parameter
4
(or
V
5
1 LSB
4096
DDA
E
(1) (2)(3)
6
T
depending on package)]
IDEAL
Doc ID 17143 Rev 2
E
7
L
(2)
f
f
V
Measurements made after
ADC calibration
E
PCLK2
ADC
DDA
D
4093 4094 4095 4096
(3)
= 14 MHz, R
= 2.4 V to 3.6 V
= 28 MHz,
Test conditions
DD
(1)
, frequency, V
E
INJ(PIN)
G
V
AIN
DDA
and I
< 10 k,
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
E
between the actual and the ideal transfer curves.
E
transition and the first ideal one.
E
transition and the last actual one.
E
between actual steps and the ideal one.
E
between any actual transition and the end point
correlation line.
T
O
G
D
L
=Total Unadjusted Error: maximum deviation
=Integral Linearity Error: maximum deviation
REF
=Differential Linearity Error: maximum deviation
=Offset Error: deviation between the first actual
=Gain Error: deviation between the last ideal
INJ(PIN)
and temperature ranges.
Electrical characteristics
in
±1.5
±1.5
±1.5
Typ
±2
±1
Section 5.3.14
Max
±2.5
±3
±2
±5
±3
(4)
does not
95/108
Unit
LSB
ai14395b

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