HCNW136 Avago Technologies US Inc., HCNW136 Datasheet - Page 12

• Manufacturer Part Number: HCNW136
• Description: Optocoupler
• Manufacturer: Avago Technologies US Inc.

Specifications of HCNW136

• No. Of Channels: 1
• Isolation Voltage: 5kV
• Optocoupler Output Type: Phototransistor
• Input Current: 16mA
• Output Voltage: 20V
• Opto Case Style: DIP
• No. Of Pins: 8
• Propagation Delay Low-high: 1µs
• Ctr Min: 19%
• Voltage - Isolation: 5000Vrms
• Number Of Channels: 1, Unidirectional
• Current - Output / Channel: 8mA
• Data Rate: 1Mbps
• Propagation Delay High - Low @ If: 200ns @ 16mA
• Current - Dc Forward (if): 25mA
• Input Type: DC
• Output Type: Open Collector
• Mounting Type: Through Hole
• Package / Case: 8-DIP (0.400", 10.16mm)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: 516-1028-5

Package Characteristics
Over recommended temperature (T
*All typicals at T
**The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous
voltage rating. For the continuous voltage rating refer to the IEC/EN/DIN EN 60747-5-2 Insulation Related Characteristics Table (if applicable), your
equipment level safety specification or Avago Application Note 1074 entitled “Optocoupler Input-Output Endurance Voltage, ” publication number
5963-2203E.
Notes:
10. The frequency at which the ac output voltage is 3 dB below its mid-frequency value.
11. The JEDEC registration for the 6N136 specifies a minimum CTR of 15%. Avago guarantees a minimum CTR of 19%.
12. See Option 020 data sheet for more information.
13. Use of a 0.1 µf bypass capacitor connected between pins 5 and 8 is recommended.
14. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 4500 V rms for 1 second (leakage
15. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 6000 V rms for 1 second (leakage
16. This rating is equally validated by an equivalent ac proof test.
12
1. Derate linearly above 70°C free-air temperature at a rate of 0.8 mA/°C (8-Pin DIP).
2. Derate linearly above 70°C free-air temperature at a rate of 1.6 mA/°C (8-Pin DIP).
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C (8-Pin DIP).
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C (8-Pin DIP).
5. CURRENT TRANSFER RATIO in percent is defined as the ratio of output collector current, I
6. Device considered a two-terminal device: Pins 1, 2, 3, and 4 shorted together and Pins 5, 6, 7, and 8 shorted together.
7. Common mode transient immunity in a Logic High level is the maximum tolerable (positive) dV
8. The 1.9 kΩ load represents 1 TTL unit load of 1.6 mA and the 5.6 kΩ pull-up resistor.
9. The 4.1 kΩ load represents 1 LSTTL unit load of 0.36 mA and 6.1 kΩ pull-up resistor.
Parameter
Input-Output
Momentary
Withstand
Voltage**
Input-Output
Resistance
Input-Output
Capacitance
Derate linearly above 85°C free-air temperature at a rate of 0.5 mA/°C (SO-8).
Derate linearly above 85°C free-air temperature at a rate of 1.0 mA/°C (SO-8).
Derate linearly above 85°C free-air temperature at a rate of 1.1 mW/°C (SO-8).
Derate linearly above 85°C free-air temperature at a rate of 2.3 mW/°C (SO-8).
mode pulse signal, V
Logic Low level is the maximum tolerable (negative) dV
output will remain in a Logic Low state (i.e., V
detection current limit, I
Related Characteristics Table if applicable.
detection current limit, I
Related Characteristics Table if applicable.
A
= 25°C.
CM
, to assure that the output will remain in a Logic High state (i.e., V
I-O
I-O
Sym.
V
R
C
I
≤ 5 µA). This test is performed before the 100% Production test shown in the IEC/EN/DIN EN 60747-5-2 Insulation
≤ 5 µA). This test is performed before the 100% Production test shown in the IEC/EN/DIN EN 60747-5-2 Insulation
I-O
ISO
I-O
I-O
(Option 020)
Widebody
Widebody
Widebody
8-Pin DIP
8-Pin DIP
8-Pin DIP
8-Pin DIP
8-Pin DIP
Device
SO-8
SO-8
SO-8
A
= 0°C to 70°C) unless otherwise specified.
O
< 0.8 V).
5000
CM
3750
5000
Min.
10
10
/dt on the trailing edge of the common mode pulse signal, V
12
11
Typ.*
10
10
0.6
0.5
12
13
Max.
0.6
1
O
V rms
Units
> 2.0 V). Common mode transient immunity in a
O
µA
pF
Ω
, to the forward LED input current, I
CM
Test Conditions
RH < 50%,
V
t = 1 min.,
T
45% RH, t = 5 s,
V
T
T
T
f = 1 MHz
/dt on the leading edge of the common
A
A
A
A
I-O
I-O
= 25°C
= 25°C
= 25°C
= 100°C
= 3 kVdc,
= 500 Vdc
CM
, to assure that the
Fig.
F
, times 100.
6, 15
6, 12,
6, 14
6, 16
Note
15
6
6