EVAL-ADXL346Z Analog Devices Inc, EVAL-ADXL346Z Datasheet - Page 4

• Manufacturer Part Number: EVAL-ADXL346Z
• Description: Inertial Sensor Evaluation System
• Manufacturer: Analog Devices Inc

Specifications of EVAL-ADXL346Z

• Silicon Manufacturer: Analog Devices
• Silicon Core Number: ADXL346
• Kit Application Type: Sensing - Motion / Vibration / Shock
• Application Sub Type: Accelerometer
• Silicon Family Name: IMEMS
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADXL346
Parameter
TEMPERATURE
WEIGHT
1
2
3
4
5
6
7
8
All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
The typical specifications shown are for at least 68% of the population of parts and are based on the worst case of mean ±1 σ except for 0 g output and sensitivity,
which represents the target value. For 0 g offset and sensitivity, the deviation from the ideal describes the worst case of mean ±1 σ.
Cross-axis sensitivity is defined as coupling between any two axes.
Bandwidth is the −3 dB frequency and is half the output data rate bandwidth = ODR/2.
The output format for the 3200 Hz and 1600 Hz ODRs is different from the output format for the remaining ODRs. This difference is described in the Data Formatting of
Upper Data Rates section.
Output data rates below 6.25 Hz exhibit additional offset shift with increased temperature, depending on selected output data rate. Refer to the Offset Performance at
Lowest Data Rates section for details.
Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0.
Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part must be in normal power
operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C) for self-test to operate correctly.
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).
Operating Temperature Range
Device Weight
Test Conditions
Rev. A | Page 4 of 40
Min
−40
1
Typ
18
2
Max
+85
1
Unit
°C
mg