BZX55C18 Fairchild Semiconductor, BZX55C18 Datasheet

DIODE ZENER 18V 500MW DO-35

BZX55C18

Manufacturer Part Number
BZX55C18
Description
DIODE ZENER 18V 500MW DO-35
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of BZX55C18

Voltage - Zener (nom) (vz)
18V
Voltage - Forward (vf) (max) @ If
1.3V @ 100mA
Current - Reverse Leakage @ Vr
100nA @ 14V
Tolerance
±5%
Power - Max
500mW
Impedance (max) (zzt)
50 Ohm
Mounting Type
Through Hole
Package / Case
DO-204AH, DO-35, Axial
Operating Temperature
-65°C ~ 200°C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence. This is a preliminary
notification. A Final PCN will be issued when qualification is complete and data is available.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Sun, Brian
E-mail: Brian.Sun@fairchildsemi.com
Phone:
Implementation of change:
Expected 1st Device Shipment Date: 2008/02/14
Earliest Year/Work Week of Changed Product: 0810
Change Type Description: Die Shrink
Description of Change (From): Two type of die dimension: 0.35mm * 0.35mm for 2.0-20V
DO35 product; 0.45mm * 0.45mm for 22-75V DO35 product.
Description of Change (To): Consolidate to one die dimension 0.32 mm * 0.32 mm for
2.4V~75V DO35 product. There is no difference in package dimension, process and electrical
specification after change.
Reason for Change : Consolidate wafer process to improve quality
Qual/REL Plan Numbers : Q20070376
Qualification :
To qualify the small die(0.32mm*0.32mm) to replace the
die(0.35mm*0.35mm,0.45*0.45mm) which is used in the current DO-35 package.
Device #1 BZX55C10
Package:
#Leads:
Environment Stress Detail:
Stress
HTOL
P/C
Standard
Technical Contact:
Name: Zhu, Adams
E-mail: Adams.Zhu@notes.fairchildsemi.com
Phone:
Qualification Stress Test and Sample Size Detail
FORECAST CHANGE NOTIFICATION
Conditions
150C
Readpoints
TP1
168
TP2
500
TP3
1000
Date Issued On : 2007/11/02
Date Created : 2007/10/11
Samples
A
77
PCN# : Q4074105
Pg. 1

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BZX55C18 Summary of contents

Page 1

... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...

Page 2

... TP2 150C 168 500 168 500 lated BV 168 500 500 1000 1N5986B 1N5989B 1N5992B 1N5995B 1N5998B 1N6001B 1N6004B 1N6007B 1N6010B 1N6013B 1N6016B BZX55C10 BZX55C13 BZX55C18 BZX55C24 BZX55C2V7 BZX55C36 BZX55C3V3 BZX55C43 1000 77 1000 77 77 Samples TP3 A 1000 77 1000 77 1000 77 77 Samples TP3 A ...

Page 3

BZX55C4V3 BZX55C56 BZX55C6V2 BZX55C8V2 BZX79C11 BZX79C15 BZX79C20 BZX79C27 BZX79C30 BZX79C39 BZX79C3V6 BZX79C47 BZX79C51 BZX79C5V6 BZX79C7V5 BZX55C4V7 BZX55C5V1 BZX55C6V8 BZX55C9V1 BZX79C12 BZX79C16 BZX79C22 BZX79C2V4 BZX79C33 BZX79C3V0 BZX79C3V9 BZX79C4V3 BZX79C56 BZX79C6V2 BZX79C8V2 BZX55C51 BZX55C5V6 BZX55C7V5 BZX79C10 BZX79C13 BZX79C18 BZX79C24 BZX79C2V7 BZX79C36 BZX79C3V3 ...

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