DIODE ZENER 3V 500MW DO-35

BZX55C3V0

Manufacturer Part NumberBZX55C3V0
DescriptionDIODE ZENER 3V 500MW DO-35
ManufacturerFairchild Semiconductor
BZX55C3V0 datasheet
Product Change Notification
 


Specifications of BZX55C3V0

Voltage - Zener (nom) (vz)3VVoltage - Forward (vf) (max) @ If1.3V @ 100mA
Current - Reverse Leakage @ Vr4µA @ 1VTolerance±5%
Power - Max500mWImpedance (max) (zzt)85 Ohm
Mounting TypeThrough HolePackage / CaseDO-204AH, DO-35, Axial
Operating Temperature-65°C ~ 200°CLead Free Status / RoHS StatusLead free / RoHS Compliant
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FORECAST CHANGE NOTIFICATION
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence. This is a preliminary
notification. A Final PCN will be issued when qualification is complete and data is available.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
If you have any questions concerning this change, please contact:
Technical Contact:
Name: Zhu, Adams
E-mail: Adams.Zhu@notes.fairchildsemi.com
Phone:
PCN Originator:
Name: Sun, Brian
E-mail: Brian.Sun@fairchildsemi.com
Phone:
Implementation of change:
Expected 1st Device Shipment Date: 2008/02/14
Earliest Year/Work Week of Changed Product: 0810
Change Type Description: Die Shrink
Description of Change (From): Two type of die dimension: 0.35mm * 0.35mm for 2.0-20V
DO35 product; 0.45mm * 0.45mm for 22-75V DO35 product.
Description of Change (To): Consolidate to one die dimension 0.32 mm * 0.32 mm for
2.4V~75V DO35 product. There is no difference in package dimension, process and electrical
specification after change.
Reason for Change : Consolidate wafer process to improve quality
Qual/REL Plan Numbers : Q20070376
Qualification :
To qualify the small die(0.32mm*0.32mm) to replace the
die(0.35mm*0.35mm,0.45*0.45mm) which is used in the current DO-35 package.
Qualification Stress Test and Sample Size Detail
Device #1 BZX55C10
Package:
#Leads:
Environment Stress Detail:
Stress
P/C
Standard
HTOL
Readpoints
Conditions
TP1
TP2
150C
168
500
Date Created : 2007/10/11
Date Issued On : 2007/11/02
PCN# : Q4074105
Samples
TP3
A
1000
77
Pg. 1

BZX55C3V0 Summary of contents

  • Page 1

    ... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...

  • Page 2

    ... Product Id Description : Affected FSIDs : 1N5985B 1N5988B 1N5991B 1N5994B 1N5997B 1N6000B 1N6003B 1N6006B 1N6009B 1N6012B 1N6015B 1N6018B BZX55C12 BZX55C16 BZX55C22 BZX55C2V4 BZX55C33 BZX55C3V0 BZX55C3V9 168 500 lated BV 168 500 500 1000 Readpoints Conditions TP1 TP2 150C 168 500 168 500 lated BV 168 ...

  • Page 3

    BZX55C4V3 BZX55C56 BZX55C6V2 BZX55C8V2 BZX79C11 BZX79C15 BZX79C20 BZX79C27 BZX79C30 BZX79C39 BZX79C3V6 BZX79C47 BZX79C51 BZX79C5V6 BZX79C7V5 BZX55C4V7 BZX55C5V1 BZX55C6V8 BZX55C9V1 BZX79C12 BZX79C16 BZX79C22 BZX79C2V4 BZX79C33 BZX79C3V0 BZX79C3V9 BZX79C4V3 BZX79C56 BZX79C6V2 BZX79C8V2 BZX55C51 BZX55C5V6 BZX55C7V5 BZX79C10 BZX79C13 BZX79C18 BZX79C24 BZX79C2V7 BZX79C36 BZX79C3V3 ...