EVAL-AD5263EBZ Analog Devices Inc, EVAL-AD5263EBZ Datasheet - Page 27

• Manufacturer Part Number: EVAL-AD5263EBZ
• Description: EVALUATION BOARD I.C.
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5263EBZ

• Main Purpose: Digital Potentiometer
• Embedded: No
• Utilized Ic / Part: AD5263
• Primary Attributes: 4 Channel, 256 Position
• Secondary Attributes: I²C & SPI Interfaces
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

RESISTANCE SCALING
The AD5263 offers 20 kΩ, 50 kΩ, and 200 kΩ nominal
resistances. Users who need a lower resistance and the same
number of step adjustments can place multiple devices in parallel.
For example, Figure 67 shows a simple scheme of using two
channels in parallel. To adjust half of the resistance linearly per
step, users need to program both channels to the same settings.
Applicable only to the voltage divider mode, by connecting
a discrete resistor in parallel as shown in Figure 68, a propor-
tionately lower voltage appears at Terminal A. This translates
into a finer degree of precision because the step size at Terminal
W is smaller. The voltage can be found as
Figure 67 and Figure 68 show applications in which the digital
potentiometers change steps linearly. On the other hand, log
taper adjustment is usually preferred in applications such as
volume control. Figure 69 shows another method of resistance
scaling which produces a pseudolog taper output. In this circuit,
the smaller the value of R2 with respect to R
output approaches log type behavior.
Figure 67. Reduce Resistance by Half with Linear Adjustment Characteristics
Figure 68. Decreasing Step Size by Lowering the Nominal Resistance
V
Figure 69. Resistor Scaling with Log Adjustment Characteristics
W
(
D
)
=
256
D
×
R1
⎛
⎜
⎜
⎝
R1
R2
LED
V
B
A
I
R1 << R
A1
B1
R2
+
(
V
R
V
V
W1
DD
A
B
AB
DD
DD
AB
||
R2
B2
A2
R1
)
W2
⎞
⎟
⎟
⎠
V
W
O
×
(
R
AB
AB
, the more the
||
R1
)
(18)
Rev. B | Page 27 of 28
RESISTANCE TOLERANCE, DRIFT, AND
TEMPERATURE COEFFICIENT MISMATCH
CONSIDERATIONS
In rheostat mode operation, such as the gain control circuit of
Figure 70, the tolerance mismatch between the digital potent-
iometer and the discrete resistor can cause repeatability issues
among various systems. Because of the inherent matching of the
silicon process, it is practical to apply the multichannel device
in this type of application. As such, R1 should be replaced by
one of the channels of the digital potentiometer. R1 should be
programmed to a specific value while R2 can be used for the
adjustable gain. Although it adds cost, this approach minimizes
the tolerance and temperature coefficient mismatch between R1
and R2. In addition, this approach also tracks the resistance
drift over time. As a result, these nonideal parameters become
less sensitive to system variations.
Notice that the circuit in Figure 71 can also be used to track the
tolerance, temperature coefficient, and drift in this particular
application. However, the characteristics of the transfer function
change from a linear to a pseudologarithmic gain function.
Figure 70. Linear Gain Control with Tracking Resistance Tolerance and Drift
Figure 71. Nonlinear Gain Control with Tracking Resistance Tolerance
1
REPLACED WITH ANOTHER CHANNEL OF RDAC
A
R
–
+
AD8601
and Drift
–
+
AD8601
U1
B
V+
U1
C1
A
AD5263