1SS226T5LFT Toshiba, 1SS226T5LFT Datasheet

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1SS226T5LFT

Manufacturer Part Number
1SS226T5LFT
Description
DIODE ULTRA HS 80V 100MA SC-59
Manufacturer
Toshiba
Datasheet

Specifications of 1SS226T5LFT

Voltage - Forward (vf) (max) @ If
1.2V @ 100mA
Current - Reverse Leakage @ Vr
500nA @ 80V
Current - Average Rectified (io) (per Diode)
100mA
Voltage - Dc Reverse (vr) (max)
80V
Reverse Recovery Time (trr)
4ns
Diode Type
Standard
Speed
Small Signal =< 200mA (Io), Any Speed
Diode Configuration
1 Pair Series Connection
Mounting Type
Surface Mount
Package / Case
SC-59
Product
Ultra Fast Recovery Rectifier
Configuration
Dual Series
Reverse Voltage
85 V
Forward Voltage Drop
1.2 V
Recovery Time
4 ns
Forward Continuous Current
0.1 A
Max Surge Current
2 A
Reverse Current Ir
0.5 uA @ 80 V
Mounting Style
SMD/SMT
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Ultra High Speed Switching Application
Absolute Maximum Ratings
Electrical Characteristics
Marking
Small package
Low forward voltage
Fast reverse recovery time : t
Small total capacitance
Note: Using continuously under heavy loads (e.g. the application of high
Forward voltage
Reverse current
Total capacitance
Reverse recovery time
Maximum (peak) reverse voltage
Reverse voltage
Maximum (peak) forward current
Average forward current
Surge current (10ms)
Power dissipation
Junction temperature
Storage temperature range
(*)
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Unit rating. Total rating = Unit rating × 0.7.
Characteristic
Characteristic
: SC-59
: V
: C
TOSHIBA Diode Silicon Epitaxial Planar Type
rr
F (3)
T
= 1.6ns (typ.)
= 0.9pF (typ.)
(Ta = 25°C)
= 0.9V (typ.)
(Ta = 25°C)
Symbol
Symbol
V
V
V
I
I
I
V
T
R (1)
R (2)
I
FSM
V
F (1)
F (2)
F (3)
C
FM
I
t
T
RM
P
stg
O
rr
R
T
j
1SS226
Circuit
Test
−55~125
300 (*)
100 (*)
Rating
2 (*)
150
125
85
80
1
I
I
I
V
V
V
I
F
F
F
F
R
R
R
= 1mA
= 10mA
= 100mA
= 10mA (Fig.1)
= 30V
= 80V
= 0, f = 1MH
Test Condition
Unit
mW
mA
mA
°C
°C
V
V
A
z
JEDEC
JEITA
TOSHIBA
Weight: 0.012g (typ.)
Min
Typ.
0.60
0.72
0.90
0.9
1.6
TO−236MOD
1−3G1G
SC−59
2007-11-01
1.20
Max
0.1
0.5
3.0
4.0
1SS226
Unit: mm
Unit
μA
pF
ns
V

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1SS226T5LFT Summary of contents

Page 1

... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc) ...

Page 2

Fig.1 Reverse recovery time test circuit ( 1SS226 2007-11-01 ...

Page 3

... Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ...

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