BAS116,215 NXP Semiconductors, BAS116,215 Datasheet - Page 5

DIODE SW EPITAXIAL MED-SPD SOT23

BAS116,215

Manufacturer Part Number
BAS116,215
Description
DIODE SW EPITAXIAL MED-SPD SOT23
Manufacturer
NXP Semiconductors
Datasheet

Specifications of BAS116,215

Package / Case
SOT-23-3, TO-236-3, Micro3™, SSD3, SST3
Mounting Type
Surface Mount
Speed
Standard Recovery >500ns, > 200mA (Io)
Reverse Recovery Time (trr)
3µs
Current - Reverse Leakage @ Vr
5nA @ 75V
Voltage - Forward (vf) (max) @ If
1.25V @ 150mA
Voltage - Dc Reverse (vr) (max)
75V
Capacitance @ Vr, F
2pF @ 0V, 1MHz
Current - Average Rectified (io)
215mA (DC)
Product
Standard Recovery Rectifier
Configuration
Single
Reverse Voltage
85 V
Forward Voltage Drop
1.25 V at 0.15 A
Recovery Time
3000 ns
Forward Continuous Current
0.215 A
Max Surge Current
4 A
Reverse Current Ir
0.005 uA
Mounting Style
SMD/SMT
Maximum Operating Temperature
+ 150 C
Minimum Operating Temperature
- 65 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
934032170215::BAS116 T/R::BAS116 T/R
NXP Semiconductors
2003 Dec 12
handbook, full pagewidth
Low-leakage diode
(1) Maximum values.
(2) Typical values.
V
Fig.5
(1) I
R
V = V
= 75 V.
(nA)
I
10
10
10
R
R
10
R = 50
10
= 1 mA.
−1
−2
−3
S
1
R
2
Reverse current as a function of junction
temperature.
0
I x R
F
S
(1)
(2)
50
I F
100
D.U.T.
Fig.7 Reverse recovery time test circuit and waveforms.
150
OSCILLOSCOPE
T
SAMPLING
R = 50
j
MGA881
(°C)
i
mlb754
200
V R
5
handbook, halfpage
10%
t r
f = 1 MHz; T
Fig.6
90%
(pF)
C d
input signal
2
1
0
0
t p
Diode capacitance as a function of reverse
voltage; typical values.
j
= 25 °C.
5
t
10
I F
output signal
15
Product data sheet
V R (V)
t rr
BAS116
MBG526
20
(1)
t

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