FQPF6N90C Fairchild Semiconductor, FQPF6N90C Datasheet
FQPF6N90C
Specifications of FQPF6N90C
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FQPF6N90C Summary of contents
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... Lot Device Q20070212AAACLV FQPF6N90C Q20070212ABACLV FQPF6N90C Q20070212ACACLV FQPF6N90C Test: (High Temperature Gate Bias) Lot Device Q20070212AAHTGB FQPF6N90C Q20070212AAHTGB FQPF6N90C Q20070212ABHTGB FQPF6N90C Q20070212ABHTGB FQPF6N90C Date Created : 2007/05/17 Date Issued On : 2007/06/26 96-HOURS Failure Code 0/77 0/77 0/77 500-HOURS 1000-HOURS 0/77 0/77 0/77 0/77 ...
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... Lot Device Q20070212AATHBT Q20070212ABTHBT Q20070212ACTHBT Test: -65C, 150C (Temperature Cycle) Lot Device Q20070212AATMCL1 FQPF6N90C Q20070212AATMCL1 FQPF6N90C Q20070212ABTMCL1 FQPF6N90C Q20070212ABTMCL1 FQPF6N90C Q20070212ACTMCL1 FQPF6N90C Q20070212ACTMCL1 FQPF6N90C Product Id Description : There are some QFET products. Affected FSIDs : FQA10N80C_F109 FQA7N80C_F109 FQA8N90C_F109 FQAF11N90C FQB6N60CTM_WS FQB8N60CTM_WS FQD5N60CTM_NL FQD6N60CTF_WS ...