FQD3N50CTF Fairchild Semiconductor, FQD3N50CTF Datasheet
FQD3N50CTF
Manufacturer Part Number
FQD3N50CTF
Description
MOSFET N-CH 500V 2.5A DPAK
Manufacturer
Fairchild Semiconductor
Series
QFET™r
Datasheet
1.FQU3N50CTU.pdf
(9 pages)
Specifications of FQD3N50CTF
Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Standard
Rds On (max) @ Id, Vgs
2.5 Ohm @ 1.25A, 10V
Drain To Source Voltage (vdss)
500V
Current - Continuous Drain (id) @ 25° C
2.5A
Vgs(th) (max) @ Id
4V @ 250µA
Gate Charge (qg) @ Vgs
13nC @ 10V
Input Capacitance (ciss) @ Vds
365pF @ 25V
Power - Max
35W
Mounting Type
Surface Mount
Package / Case
DPak, TO-252 (2 leads+tab), SC-63
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: LEE, JEONGSOO
E-mail: JEONGSOO.LEE@fairchildsemi.com
Phone: 82-32-680-1311
Implementation of change:
Expected 1st Device Shipment Date: 2008/08/10
Earliest Year/Work Week of Changed Product: WW33
Change Type Description: Passivation Material, Fab Process Change
Description of Change (From): There is no passivation layer.
Description of Change (To): Adding Passivation layer on front metal.
Reason for Change : To improve product quality.
Qual/REL Plan Numbers : Q20070212
Qualification :
All items were passed.
Results/Discussion
Test: (Autoclave)
Lot
Q20070212AAACLV
Q20070212ABACLV
Q20070212ACACLV
Test: (High Temperature Gate Bias)
Lot
Q20070212AAHTGB
Q20070212AAHTGB
Q20070212ABHTGB
Q20070212ABHTGB
Q20070212ACHTGB
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: LEE, JEONGSOO
E-mail: JEONGSOO.LEE@fairchildsemi.com
Phone: 82-32-680-1311
Device
FQPF6N90C
FQPF6N90C
FQPF6N90C
FQPF6N90C
FQPF6N90C
Device
FQPF6N90C
FQPF6N90C
FQPF6N90C
500-HOURS
0/77
0/77
0/77
96-HOURS
0/77
0/77
0/77
1000-HOURS
0/77
0/77
Date Issued On : 2008/05/14
Date Created : 2008/05/09
Failure Code
Failure Code
PCN# : Q2081907
Pg. 1
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FQD3N50CTF Summary of contents
Page 1
... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
Page 2
... FQP5N50C FQP6N50C FQPF12N60C FQPF13N50CSDTU FQPF13N50C_TC003 FQPF3N50C FQPF9N50C FQU2N60CTU FQU5N50CTU Failure Code 1000-HOURS Failure Code 0/77 0/77 0/77 Failure Code FQB13N50CTM FQB9N50CTM FQD2N60CTF_F105 FQD3N50CTF FQD3N50CTM_WS FQD5N50CTF FQD5N50CTM_F101 FQD6N50CTM FQD6N50CTM_WS FQI9N50CTU FQP13N50C FQP2N60C FQP3N50C_F080 FQP5N50C_F080 FQP9N50C FQPF12N60CT FQPF13N50CT FQPF2N60C FQPF5N50C FQPF9N50CT FQU3N50CTU FQU5N50CTU_WS ...