MMU01020C3302FB300 Vishay, MMU01020C3302FB300 Datasheet - Page 9

• Manufacturer Part Number: MMU01020C3302FB300
• Description: Res Thin Film 0805 33K Ohm 1% 1/5W ±50ppm/°C Molded Melf SMD Blister T/R
• Manufacturer: Vishay
• Type: Thin Filmr
• Series: MMUr

Specifications of MMU01020C3302FB300

• Case Size: 0805
• Resistance Value: 33 KOhm
• Power Rating: 1/5 W
• Tolerance: 1 %
• Resistance (ohms): 33K
• Number Of Terminations: 2
• Package / Case: MELF, 0102
• Power (watts): 0.3W
• Composition: Thin Film
• Temperature Coefficient: ±50ppm/°C
• Size / Dimension: 0.043" Dia x 0.087" L (1.10mm x 2.20mm)
• Resistance: 33 KOhms
• Voltage Rating: 150 Volts
• Termination Style: MELF
• Dimensions: 1.1 mm Dia. x 2.2 mm L
• Product: Thin Film Resistors SMD
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Height: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: MMU-33.0KCTR

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20
MMU 0102, MMA 0204, MMB 0207 - Professional
Vishay Beyschlag
TEST AND REQUIREMENTS
All tests are carried out in accordance with the following
specifications:
EN 60115-1, generic specification
EN 140400, sectional specification
EN 140401-803, detail specification
The components are approved in accordance with the
IECQ-CECC-system, where applicable. For the full test
schedule refer to the documents listed above. The testing
also covers most of the requirements specified by
EIA/IS-703 and JIS-C-5202.
The tests are carried out in accordance with IEC 60068* and
under standard atmospheric conditions in accordance with
IEC 60068-1, 5.3*. Climatic category LCT/UCT/56 (rated
temperature range: Lower Category Temperature, Upper
Category Temperature; damp heat, long term, 56 days) is valid.
CLAUSE
60115-1
TEST PROCEDURES AND REQUIREMENTS
4.5
4.8.4.2
4.25.1
4.25.3
4.24
EN
METHOD
60068-2*
78 (Cab)
TEST
IEC
-
-
-
-
resistance
temperature
coefficient
endurance at
70 °C: standard
operation mode
endurance at
70 °C: power
operation mode
endurance at
upper category
temperature
damp heat,
steady state
TEST
stability for product
types:
at 20/- 55/20 °C and
20/125/20 °C
U =
≤ U
1.5 h on; 0.5 h off;
U =
≤ U
1.5 h on; 0.5 h off;
125 °C; 1000 h
155 °C; 1000 h
(40 ± 2) °C;
56 days;
(93 ± 3) % RH
For technical questions contact:
PROCEDURE
70 °C; 1000 h
70 °C; 8000 h
70 °C; 1000 h
70 °C; 8000 h
max
max
P
P
;
;
70
70
MMU 0102
MMA 0204
MMB 0207
-
×
×
R
R
Professional MELF Resistors
STABILITY CLASS
± (0.15 % R + 10 mΩ) ± (0.5 % R + 10 mΩ)
± (0.15 % R + 5 mΩ) ± (0.25 % R + 5 mΩ)
± (0.3 % R + 5 mΩ)
± 1 % R; ± 0.5 % R
10 Ω to 332 kΩ
10 Ω to 221kΩ
OR BETTER
10 Ω to 1 MΩ
0.25
Unless otherwise specified the following values apply:
Temperature: 15 °C to 35 °C
Relative humidity: 45 % to 75 %
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar).
The components are mounted for testing on printed-circuit
boards in accordance with EN 140400, 2.3.3, unless
otherwise specified.
The requirements stated in the Test Procedures and
Requirements table are based on the required tests and
permitted limits of EN 140401-803. However, some
additional tests and a number of improvements against those
minimum requirements have been included. The stated
requirements for long-term tests are typically fulfilled with a
statistical safety of at least
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± (0.25 % R + 10 mΩ)
± (0.15 % R+ 10 mΩ)
± (0.3 % R + 10 mΩ)
± (0.5 % R + 10 mΩ)
± (0.5 % R + 5 mΩ)
± 2 % R; ± 1 % R
OR BETTER
1Ω to < 10 Ω
1Ω to < 10 Ω
1Ω to < 10 Ω
STABILITY
CLASS 0.5
PERMISSIBLE CHANGE (ΔR)
± 50 ppm/K; ± 25 ppm/K
REQUIREMENTS
STABILITY CLASS
± (0.5 % R + 5 mΩ)
± (1 % R + 10 mΩ)
± (1 % R + 5 mΩ)
OR BETTER
x
± 5 % R
< 1 Ω
< 1 Ω
< 1 Ω
+ 5 s.
1
Document Number: 28713
± (0.5 % R + 10 mΩ)
± (0.5 % R + 10 mΩ)
± (1 % R + 10 mΩ)
± (1 % R + 10 mΩ)
± (1 % R + 10 mΩ)
Revision: 18-Jul-06
+ (1 % R + 5 mΩ)
+ (2 % R + 5 mΩ)
OR BETTER
STABILITY
CLASS 2
> 221 kΩ
> 332 kΩ
± 1 % R
> 1 MΩ