KSC5338DTU Fairchild Semiconductor, KSC5338DTU Datasheet

TRANSISTOR NPN 450V 5A TO-220

KSC5338DTU

Manufacturer Part Number
KSC5338DTU
Description
TRANSISTOR NPN 450V 5A TO-220
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of KSC5338DTU

Transistor Type
NPN
Current - Collector (ic) (max)
5A
Voltage - Collector Emitter Breakdown (max)
450V
Vce Saturation (max) @ Ib, Ic
500mV @ 200mA, 1A
Current - Collector Cutoff (max)
100µA
Dc Current Gain (hfe) (min) @ Ic, Vce
6 @ 2A, 1V
Power - Max
75W
Frequency - Transition
11MHz
Mounting Type
Through Hole
Package / Case
TO-220-3 (Straight Leads)
Transistor Polarity
NPN
Mounting Style
Through Hole
Collector- Emitter Voltage Vceo Max
450 V
Emitter- Base Voltage Vebo
12 V
Maximum Dc Collector Current
5 A
Power Dissipation
75 W
Maximum Operating Temperature
+ 150 C
Continuous Collector Current
5 A
Dc Collector/base Gain Hfe Min
25
Maximum Operating Frequency
11 MHz
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
KSC5338DTU
Manufacturer:
Fairchild Semiconductor
Quantity:
35 937
Part Number:
KSC5338DTU
Manufacturer:
IR
Quantity:
4 000
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Sun, Brian
E-mail: Brian.Sun@fairchildsemi.com
Phone:
Implementation of change:
Expected 1st Device Shipment Date: 2008/01/29
Earliest Year/Work Week of Changed Product: 0805
Change Type Description: Lead Frame Dimensions (Internal and External)
Description of Change (From): Current TO-220 heatsink and die attach pad thickness of
1.30mm.
Description of Change (To): New TO-220 heatsink and die attach pad thickness will be
0.51mm. There is no change in heatsink and die attach pad material. Conversion of heatsink
thickness will be done on a part by part basis starting WW05 of 2008 to prevent mixing of
product with different heat sink dimensions in shipments during the transition period.
Reason for Change : Enhancement of leadframe design to improve package mechanical
performance and support additional demand for various TO-220 products to improve our
service to customers. There is insignificant difference in product thermal performance.
Qual/REL Plan Numbers : Q20070208
Qualification :
Passed and meet the FSC rel performance requirement
Change From
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: LEE, SANGDO
E-mail: SANGDO.LEE@fairchildsemi.com
Phone: 86-512-6762-3311 ext 8671
Date Issued On : 2007/11/29
Date Created : 2007/11/16
PCN# : Q3073802-A
Pg. 1

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KSC5338DTU Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

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Change To Pg. 2 ...

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Results/Discussion Test: (Autoclave) Lot Device Q20070208AAACLV MC78T12CT Q20070208BAACLV KA350TU Q20070208CAACLV KSE13003TH2ATU Q20070208DAACLV KSE13009TU Q20070208EAACLV FJP5027RTU_F080 Test: (High Temperature Reverse Bias) Lot Device Q20070208CAHTRB KSE13003TH2ATU Q20070208DAHTRB KSE13009TU Q20070208EAHTRB FJP5027RTU_F080 Test: (High Temperature Storage Life) Lot Device Q20070208AAHTSL MC78T12CT Q20070208BAHTSL KA350TU Q20070208CAHTSL ...

Page 4

Test: (Temperature Humidity Biased Test) Lot Device Q20070208AATHBT MC78T12CT Q20070208BATHBT KA350TU Q20070208CATHBT KSE13003TH2ATU Q20070208DATHBT KSE13009TU Q20070208EATHBT FJP5027RTU_F080 Test: -65C, 150C (Temperature Cycle) Lot Device Q20070208AATMCL1 MC78T12CT Q20070208AATMCL1 MC78T12CT Q20070208BATMCL1 KA350TU Q20070208BATMCL1 KA350TU Q20070208CATMCL1 KSE13003TH2ATU Q20070208CATMCL1 KSE13003TH2ATU Q20070208DATMCL1 KSE13009TU Q20070208DATMCL1 KSE13009TU ...

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KSD362R KSD363OTU KSD363Y KSD401G KSD401YTU KSD526Y KSD560OTU KSD560Y KSD568RTU KSD569RTU KSD73Y KSD880OPATU KSE13009TU KSE3055T KSE44H11 KSE45H11TU MBR3030CTTU MBRP3010NTU MBRP3045NTU_F080 MJE2955TTU_NL TIP102 TIP105 TIP107 TIP110TU TIP112 TIP115TU TIP120 TIP121TU TIP122TU_NL TIP125TU TIP127 TIP142TTU TIP29 TIP29C TIP30C TIP31A TIP31C TIP32A TIP32C TIP41A ...

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