TIP126 Fairchild Semiconductor, TIP126 Datasheet

TRANS PNP DARL 80V 5A TO-220

TIP126

Manufacturer Part Number
TIP126
Description
TRANS PNP DARL 80V 5A TO-220
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of TIP126

Transistor Type
PNP - Darlington
Current - Collector (ic) (max)
5A
Voltage - Collector Emitter Breakdown (max)
80V
Vce Saturation (max) @ Ib, Ic
4V @ 20mA, 5A
Current - Collector Cutoff (max)
2mA
Dc Current Gain (hfe) (min) @ Ic, Vce
1000 @ 3A, 3V
Power - Max
2W
Mounting Type
Through Hole
Package / Case
TO-220-3 (Straight Leads)
Polarity
PNP
Number Of Elements
1
Collector-emitter Voltage
80V
Collector-base Voltage(max)
80V
Emitter-base Voltage (max)
5V
Collector-emitter Saturation Voltage
2@12mA@3A/4@20mA@5AV
Collector Current (dc) (max)
5A
Operating Temp Range
-65C to 150C
Operating Temperature Classification
Military
Mounting
Through Hole
Pin Count
3 +Tab
Package Type
TO-220
Configuration
Single
Transistor Polarity
PNP
Mounting Style
Through Hole
Collector- Emitter Voltage Vceo Max
80 V
Emitter- Base Voltage Vebo
5 V
Collector- Base Voltage Vcbo
80 V
Maximum Dc Collector Current
5 A
Maximum Collector Cut-off Current
1000 uA
Maximum Operating Temperature
+ 150 C
Dc Collector/base Gain Hfe Min
1000
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Frequency - Transition
-
Lead Free Status / Rohs Status
Compliant

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This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Sun, Brian
E-mail: Brian.Sun@fairchildsemi.com
Phone:
Implementation of change:
Expected 1st Device Shipment Date: 2008/01/29
Earliest Year/Work Week of Changed Product: 0805
Change Type Description: Lead Frame Dimensions (Internal and External)
Description of Change (From): Current TO-220 heatsink and die attach pad thickness of
1.30mm.
Description of Change (To): New TO-220 heatsink and die attach pad thickness will be
0.51mm. There is no change in heatsink and die attach pad material. Conversion of heatsink
thickness will be done on a part by part basis starting WW05 of 2008 to prevent mixing of
product with different heat sink dimensions in shipments during the transition period.
Reason for Change : Enhancement of leadframe design to improve package mechanical
performance and support additional demand for various TO-220 products to improve our
service to customers. There is insignificant difference in product thermal performance.
Qual/REL Plan Numbers : Q20070208
Qualification :
Passed and meet the FSC rel performance requirement
Change From
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: LEE, SANGDO
E-mail: SANGDO.LEE@fairchildsemi.com
Phone: 86-512-6762-3311 ext 8671
Date Issued On : 2007/11/29
Date Created : 2007/11/16
PCN# : Q3073802-A
Pg. 1

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TIP126 Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

Page 2

Change To Pg. 2 ...

Page 3

Results/Discussion Test: (Autoclave) Lot Device Q20070208AAACLV MC78T12CT Q20070208BAACLV KA350TU Q20070208CAACLV KSE13003TH2ATU Q20070208DAACLV KSE13009TU Q20070208EAACLV FJP5027RTU_F080 Test: (High Temperature Reverse Bias) Lot Device Q20070208CAHTRB KSE13003TH2ATU Q20070208DAHTRB KSE13009TU Q20070208EAHTRB FJP5027RTU_F080 Test: (High Temperature Storage Life) Lot Device Q20070208AAHTSL MC78T12CT Q20070208BAHTSL KA350TU Q20070208CAHTSL ...

Page 4

Test: (Temperature Humidity Biased Test) Lot Device Q20070208AATHBT MC78T12CT Q20070208BATHBT KA350TU Q20070208CATHBT KSE13003TH2ATU Q20070208DATHBT KSE13009TU Q20070208EATHBT FJP5027RTU_F080 Test: -65C, 150C (Temperature Cycle) Lot Device Q20070208AATMCL1 MC78T12CT Q20070208AATMCL1 MC78T12CT Q20070208BATMCL1 KA350TU Q20070208BATMCL1 KA350TU Q20070208CATMCL1 KSE13003TH2ATU Q20070208CATMCL1 KSE13003TH2ATU Q20070208DATMCL1 KSE13009TU Q20070208DATMCL1 KSE13009TU ...

Page 5

BDX34C BDX53C BDX53C_NL BDX54BTU BDX54TU BU407 BU408 BU807TU BUT11ATU BUT12ATU D44H11TU FJP13007H2TU FJP13009 FJP13009TU FJP3305H2TU FJP5027RTU FJP5304DTU FJP5355TU FJP5555TU FYP1004DNTU FYP1010DNTU_NL FYP1545DNTU FYP2006DNTU_NL FYP2045DNTU KSA1010Y KSA614OTU KSA614Y KSA940H1TU KSA940TU KSB546YTU KSB596Y KSB601Y KSB707OTU KSB708OTU KSB834O KSC1507O KSC1507Y KSC2073H1TU KSC2073TU KSC2334R ...

Page 6

... KSD526OTU_F080 KSD526YTU_F080 KSD560RTU KSD568OTU KSD569OTU KSD73O KSD880O KSD880YTU KSE2955TTU KSE44A11TU KSE45H11 KSE45H8TU MBRP2045NTU MBRP3045NTU MJE2955TTU TIP100 TIP102_NL TIP106 TIP110 TIP111TU TIP115 TIP117TU_F080 TIP121 TIP122TU TIP125 TIP126TU TIP142T TIP147TTU TIP29ATU TIP30ATU TIP31 TIP31B TIP32 TIP32BTU TIP41 TIP41BTU TIP41CTU_NL TIP42B TIP47 TIP48TU TIP50TU Pg. 6 ...

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