2N5307 Fairchild Semiconductor, 2N5307 Datasheet

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... These ratings are limiting values above which the serviceability of any semiconductor device may be impaired. NOTES: 1) These ratings are based on a maximum junction temperature of 150 degrees C. 2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations. ©2002 Fairchild Semiconductor Corporation 2N5307 T =25 C unless otherwise noted a Parameter ...

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... Output Capacitance ob h Small-Signal Current Gain fe * Pulse Test: Pulse 300 s, Duty Cycle 2.0% Thermal Characteristics Symbol P Total Device Dissipation D Derate above Thermal Resistance, Junction to Case JC R Thermal Resistance, Junction to Ambient JA ©2002 Fairchild Semiconductor Corporation T =25 C unless otherwise noted a Test Condition I = 10mA 0 0 ...

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... Package Dimensions 0.46 0.10 1.27TYP [1.27 ] 0.20 ©2002 Fairchild Semiconductor Corporation TO-92 +0.25 4.58 –0.15 1.27TYP [1.27 ] 0.20 3.60 0.20 (R2.29) +0.10 0.38 –0.05 Dimensions in Millimeters Rev. B, July 2002 ...

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CROSSVOLT â â â â Rev. I ...