MT41J256M8HX-15E:D Micron Technology Inc, MT41J256M8HX-15E:D Datasheet - Page 52

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MT41J256M8HX-15E:D

Manufacturer Part Number
MT41J256M8HX-15E:D
Description
MICMT41J256M8HX-15E:D 2GB:X4,X8,X16 DDR3
Manufacturer
Micron Technology Inc
Type
DDR3 SDRAMr
Series
-r
Datasheets

Specifications of MT41J256M8HX-15E:D

Organization
256Mx8
Address Bus
18b
Maximum Clock Rate
1.333GHz
Operating Supply Voltage (typ)
1.5V
Package Type
FBGA
Operating Temp Range
0C to 95C
Operating Supply Voltage (max)
1.575V
Operating Supply Voltage (min)
1.425V
Supply Current
165mA
Pin Count
78
Mounting
Surface Mount
Operating Temperature Classification
Commercial
Format - Memory
RAM
Memory Type
DDR3 SDRAM
Memory Size
2G (256M x 8)
Speed
667MHz
Interface
Parallel
Voltage - Supply
1.425 V ~ 1.575 V
Operating Temperature
0°C ~ 95°C
Package / Case
78-TFBGA
Lead Free Status / RoHS Status
Compliant

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ODT Characteristics
Figure 21:
Table 32:
ODT Resistors
PDF: 09005aef826aaadc/Source: 09005aef82a357c3
DDR3_D3.fm - Rev G 2/09 EN
Parameter/Condition
R
Deviation of VM with respect to V
TT
effective impedance
On-Die Termination DC Electrical Characteristics
ODT Levels and I-V Characteristics
Notes:
ODT effective resistance R
DM, DQS, DQS#, and TDQS, TDQS# balls (x8 devices only). The ODT target values are
listed in Table 32 and Table 33 on page 53. A functional representation of the ODT is
shown in Figure 21. The individual pull-up and pull-down resistors (R
are defined as follows:
• R
• R
1. Tolerance limits are applicable after proper ZQ calibration has been performed at a stable
2. Measurement definition for R
3. Measure voltage (VM) at the tested pin with no load:
4. For IT devices, the minimum values are derated by 6% when the device operates between –
Table 33 on page 53 provides an overview of the ODT DC electrical characteristics. The
values provided are not specification requirements; however, they can be used as design
guidelines to indicate what R
• R
• R
• R
• R
• R
To
other
circuitry
such as
RCV, . . .
temperature and voltage (V
either the temperature or voltage changes after calibration.
I[V
40°C and 0°C (T
TT PU
TT PD
TT
TT
TT
TT
TT
IH
Chip in termination mode
DD
120Ω is made up of R
60Ω is made up of R
40Ω is made up of R
30Ω is made up of R
20Ω is made up of R
(
AC
Q/2
= (V
= (V
)], then apply V
R
R
TT PU
TT PD
I
I
ODT
PU
PD
OUT
DD
R
TT
Q - V
)/|I
C
ΔVM
Symbol
).
R
=
ΔVM
TT
OUT
OUT
------------------------------------------------------------- -
|I V
_
EFF
(
=
|, under the condition that R
IL
V
)/|I
(
IH AC
IH AC
AC
TT
2
----------------- - 1
TT 60PD120
TT 40PD80
TT 30PD60
TT 20PD40
V
(
OUT
(
TT 120PD240
I
) to pin under test and measure current I[V
I
OUT
×
OUT
DD
DD
is defined by MR1[9, 6, and 2]. ODT is applied to the DQ,
TT
52
VM
TT
= I
)
Q = V
) V
Q
|, under the condition that R
is targeted to provide:
) I V
PD
: Apply V
V
V
V
DQ
DD
OUT
SS
- I
Min
Q
(
Q
PU
–5
and R
and R
and R
IL AC
DD
and R
IL AC
(
, V
×
and R
Micron Technology, Inc., reserves the right to change products or specifications without notice.
(
100
SS
IH
)
TT 20PU40
TT 40PU80
TT 30PU60
Q = V
(
)
TT 60PU120
See Table 33 on page 53
AC
)|
TT 120PU240
) to pin under test and measure current
Nom
SS
2Gb: x4, x8, x16 DDR3 SDRAM
). Refer to “ODT Sensitivity” on page 53 if
TT PU
is turned off
TT PD
Max
©2006 Micron Technology, Inc. All rights reserved.
ODT Characteristics
+5
is turned off
IL
(
TT PU
AC
)]:
Units
%
and R
TT PD
Notes
1, 2, 3
1, 2
)

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