5962-8961403MXA E2V, 5962-8961403MXA Datasheet - Page 16

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5962-8961403MXA

Manufacturer Part Number
5962-8961403MXA
Description
Manufacturer
E2V
Datasheet

Specifications of 5962-8961403MXA

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DSCC FORM 2234
APR 97
wavelength of 2537 Angstroms (Å). The integrated dose (i.e., ultraviolet intensity times exposure time) for erasure should be
minimum of 15 ws/cm
is approximately 15 to 20 minutes using an ultraviolet lamp with a 12,000 uW/cm
within one inch of the lamp tubes during erasure. The maximum integrated dose the device can be exposed to without damage
is 7258 ws/cm
permanent damage.
made available upon request.
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical
parameters to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option,
either perform delta measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7, and
9.
classes Q and V or MIL-PRF-38535, appendix A for device class M.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users
and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering
microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.
4.5 Erasing procedures. The recommended erasure procedure is exposure to shortwave ultraviolet light which has a
4.6 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
4.7 Delta measurements for device classes V. Delta measurements, as specified in table IIA, shall be made and recorded
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
2
(1 week at 12,000 uW/cm
2
STANDARD
for device types 01-12, 17-20, and 25 ws/cm
1/ The above parameter shall be recorded before and after the required
I
I
I
CC3
LI
LO
burn-in and life tests to determine the delta .
Test
standby
2
). Exposure of the device to high intensity ultraviolet light for long periods may cause
1/
TABLE IIB. Delta limits at +25 C.
10% of specified value in table IA
10% of specified value in table IA
10% of specified value in table IA
2
Device types
SIZE
for device types 13-16. The erasure time with this dosage
A
All
2
REVISION LEVEL
power rating. The device should be placed
F
SHEET
5962-89614
16

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