5962-8961403MXA E2V, 5962-8961403MXA Datasheet - Page 4

• Manufacturer Part Number: 5962-8961403MXA
• Manufacturer: E2V

Specifications of 5962-8961403MXA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Unless otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DoDISS
cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS are the issues of the
documents cited in the solicitation.
Race Street, Philadelphia, PA 19103.)
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)
the documents. These documents also may be available in or through libraries or other informational services.)
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
shall be as specified on figure 2 herein. When required, in screening (see 4.2 herein), or quality conformance inspection
groups A, B, C, or D (see 4.4 herein), the devices shall be programmed by the manufacturer prior to test in a checkerboard or
similar pattern (a minimum of 50 percent of the total number of bits programmed).
electrical performance characteristics and postirradiation parameter limits are as specified in table IA and shall apply over the
full case operating temperature range.
tests for each subgroup are defined in table IA.
manufacturer prior to delivery.
specified in 4.5 herein.
22201.)
2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials, 1916
(Applications for copies should be addressed to the Electronics Industries Association, 2500 Wilson Boulevard, Arlington, VA
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.3.1 Unprogrammed devices. The truth table for unprogrammed devices for contracts involving no altered item drawing
3.2.3.2 Programmed devices. The requirements for supplying programmed devices are not part of this document.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
3.5 Processing EPROM's. All testing requirements and quality assurance provisions herein shall be satisfied by the
3.5.1 Erasure of EPROM's. When specified, devices shall be erased in accordance with the procedure and characteristics
ASTM Standard F1192-95
JEDEC Standard EIA/JESD78
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
STANDARD
-
Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
-
IC Latch-Up Test.
SIZE
A
REVISION LEVEL
F
SHEET
5962-89614
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