NQ5000P S L9TN Intel, NQ5000P S L9TN Datasheet - Page 407

• Manufacturer Part Number: NQ5000P S L9TN
• Manufacturer: Intel

Specifications of NQ5000P S L9TN

• Mounting: Surface Mount
• Lead Free Status / RoHS Status: Not Compliant

Testability
Table 8-3.
8.1.9
Figure 8-6.
Intel® 5000P/5000V/5000Z Chipset Memory Controller Hub (MCH) Datasheet
Public TAP Instructions
Public Data Instructions
This section describes the data registers that are accessed by the public and private
instructions. Data shifts into all chains through the MSB of the data register as shown in
Figure 8-6
TAP Data Register
BYPASS
EXTEST
SAMPLE/
PRELOAD
IDCODE
CLAMP
HIGHZ
Instructio
n
which is the same as the instruction register.
Encoding
11111111
00000000
00000001
0000010
0000100
0001000
Boundary Scan
Boundary Scan
Boundary Scan
IDCODE
Bypass
Bypass
Data Register
Selected
The BYPASS command selects the Bypass register, a single bit
register connected between the TDI and TDO pins. This allows
more rapid movement of test data to and from other
components in the system.
The EXTEST instruction allows circuitry or wiring external to
the devices to be tested. Boundary Scan register cells at
outputs are used to apply stimulus, while Boundary Scan
register cells at inputs are used to capture data.
The SAMPLE/PRELOAD instruction is used to allow scanning of
the Boundary Scan register without causing interference to the
normal operation of the device. Two functions can be
performed by use of the SAMPLE/PRELOAD instruction:
1.
2.
The IDCODE instruction is forced into the parallel output
latches of the instruction register during the Test-Logic-Tap
state. This allows the Device Identification register to be
selected by manipulation of the broadcast TMS and TCK signals
for testing purposes, as well as by a conventional instruction
register scan operation.
This allows static “guarding” values to be set into components
that are not specifically being tested while maintaining the
Bypass register as the serial path through the device.
The HIGHZ instruction is used to force all outputs of the device
(except TDO) into a high impedance state. This instruction
shall select the Bypass register to be connected between TDI
and TDO in the Shift-DR controller state.
SAMPLE allows a snapshot of the data flowing into and
out of the device to be taken without affecting the normal
operation of the device.
PRELOAD allows an initial pattern to be placed into the
Boundary Scan register cells. This allows initial known
data to be present prior to the selection of another
Boundary Scan test operation.
Description
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