M38510/21002BJA E2V, M38510/21002BJA Datasheet

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M38510/21002BJA

Manufacturer Part Number
M38510/21002BJA
Description
Manufacturer
E2V
Datasheet

Specifications of M38510/21002BJA

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Part Number:
M38510/21002BJA
Manufacturer:
TI
Quantity:
2
(PROM) microcircuits which employ thin film nichrome (NiCr) resistors, platinum-silicide, tungsten (W), titanium-tungsten
(TiW) or zapped vertical emitter as the fusible link or programming element. Two product assurance classes and a choice of
case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the
requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4).
AMSC N/A
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, programmable read-only memory
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
MICROCIRCUIT, DIGITAL, 16,384 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM),
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
mailto:memory@dla.mil
address information using the ASSIST Online database at
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535.
Outline letter
J
K
R
L
3
Device type
01
02
03
04
05
. Since contact information can change, you may want to verify the currency of this
Descriptive designator
GDIP1-T24 or CDIP2-T24
GDFP2-F24 or CDFP3-F24
GDIP1-T20 or CDIP2-T20
GDIP3-T24 or CDIP4-T24
CQCC1-N28
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
Inactive for new design after 24 July 1995
2048 words/8 bits per word PROM with uncommitted
collector
2048 words/8 bits per word PROM with active pull-up
and a third high-impedance state output
2048 words/8 bits per word PROM with uncommitted
2048 words/8 bits per word PROM with active pull-up
And a third high-impedance state output
4096 words/4 bits per word PROM with active pull-up
and a third high-impedance state output
collector
MILITARY SPECIFICATION
MONOLITHIC SILICON
Circuit
http://assist.daps.dla.mil
Terminals
24
24
20
24
28
Package style
Dual-in-line
Flat pack
Dual-in-line
Dual-in-line
Square leadless chip carrier
MIL-M-38510/210E
27 March 2006
SUPERSEDING
MIL-M-38510/210D
16 May 1986
Access times (ns)
FSC 5962
INCH-POUND
100, 50
100, 50
55, 30
55, 30
80, 40

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M38510/21002BJA Summary of contents

Page 1

MICROCIRCUIT, DIGITAL, 16,384 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), This specification is approved for use by all Departments The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535. 1. SCOPE 1.1 Scope. This ...

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Absolute maximum ratings. Supply voltage range ............................................................................. -0 +7 Input voltage range ................................................................................ - Storage temperature range .................................................................... -65°C to +150°C Lead temperature (soldering, 10 ...

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Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification ...

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TABLE I Test Symbol High-level output voltage V OH Low-level output voltage V OL Input clamp voltage V IC Maximum collector cut-off I CEX current High-impedance (off-state) I OHZ output high current High-impedance (off-state) I OLZ output low current High-level ...

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MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters for unprogrammed devices Final electrical test parameters for programmed devices Group A test requirements Group B end-point electrical parameters subgroup 5 Group C end-point electrical parameters Group D test requirements ...

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VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF- 38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, ...

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Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and ...

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Programming procedure for circuit A. The programming characteristics of table IVA and the following procedures shall be used for programming the device. a. Connect the device in the electrical configuration for programming. The waveforms on figure 5A and the ...

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If any bit does not verify as programmed, it shall be considered a programming reject. 4.9 Programming procedures for circuit C, device types 02 and 04. The programming characteristics of table IVC and the following procedures shall be used ...

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Return the Wait TD and lower Wait TD and lower properly blown fuse will read VOL and unblown fuse ...

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If the bit verifies as having been programmed at V shall be followed: (1) If the current required to program was less than I (2) If the current required to program was equal to or greater than IOP(max), then ...

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Programming procedures for circuit G. The programming characteristics on table IVG and the following procedures shall be used for programming the devices: a. Connect the device in the electrical configuration for programming. The waveforms on figure 5G and the ...

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Programming procedures for circuit H. The programming characteristics of table IVH and the following procedures shall be used for programming the device. a. Connect the device in the electrical configuration for programming. The waveforms on figure 5H and the ...

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The outputs should be programmed one output at a time, since the internal decoding circuitry is capable of sinking only one unit of programming current at a time. Note that the PROM is supplied with fuses generating a low-level ...

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MIL-M-38510/210E Device type 01, 02, 03, 04 Case outline J, K, and L Terminal number GND 13 ...

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WORD NO A10 ...

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MIL-M-38510/210E Device types 01 and 02 Circuit A FIGURE 3. Functional block diagrams. 17 ...

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MIL-M-38510/210E Device type 05 Circuit A FIGURE 3. Functional block diagrams – Continued. 18 ...

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MIL-M-38510/210E Device types 01 and 02 Circuit B FIGURE 3. Functional block diagram – Continued. 19 ...

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MIL-M-38510/210E Device types 01, 02, and 04 Circuit C FIGURE 3. Functional block diagrams – Continued. 20 ...

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MIL-M-38510/210E Device type 05 Circuit C FIGURE 3. Functional block diagrams - Continued 21 ...

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MIL-M-38510/210E Device types 02, 03, and 04 Circuit D FIGURE 3. Functional block diagrams – Continued. 22 ...

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MIL-M-38510/210E Device type 02 Circuits F and I FIGURE 3. Functional block diagrams – Continued. 23 ...

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MIL-M-38510/210E Device type 01 Circuit G FIGURE 3. Functional block diagrams – Continued. 24 ...

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MIL-M-38510/210E Device type 02 Circuit G FIGURE 3. Functional block diagrams – Continued. 25 ...

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MIL-M-38510/210E Device types 02 and 04 Circuit H FIGURE 3. Functional block diagram – Continued. 26 ...

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MIL-M-38510/210E Device type 02 Circuit J FIGURE 3. Functional block diagrams – Continued. 27 ...

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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

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NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

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NOTE: 1. All other waveform characteristics shall be as specified in table IVA. FIGURE 5A. Programming voltage waveforms during programming for circuit A. MIL-M-38510/210E 30 ...

Page 31

FIGURE 5B. Programming voltage waveforms during programming for circuit B. NOTE: All other waveforms characteristics shall be as specified in table IVC. FIGURE 5C. Programming voltage waveforms during programming for circuit C, device types 02 and 04. MIL-M-38510/210E 31 ...

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FIGURE 5C. Programming voltage waveforms during programming for circuit C, device type 05 - Continued. MIL-M-38510/210E 32 ...

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MIL-M-38510/210E FIGURE 5D. Programming voltage waveforms during programming for circuit D. 33 ...

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FIGURE 5E. Programming waveforms for circuit E have been discontinued. NOTES: 1. Output load is 0.2 mA and 12 mA during 7.0 V and 4.0 V check, respectively. 2. All other waveform characteristics shall be as specified in table IVF. ...

Page 35

MIL-M-38510/210E FIGURE 5G. Programming voltage waveforms during programming for circuit G. 35 ...

Page 36

MIL-M-38510/210E FIGURE 5H. Programming voltage waveforms during programming for circuit H. 36 ...

Page 37

NOTES: 1. All delays between edges are specified from completion of the first edge, not midpoints. must be greater than 100 ns; maximum delays of 1 µs are recommended to 2. Delays and t ...

Page 38

MIL-M-38510/210E FIGURE 5J. Programming voltage waveforms during programming for circuit J. 38 ...

Page 39

Terminal conditions: (Outputs not designated are open or resistive coupled to GND or voltage. Subgroup Symbol MIL- Cases STD- J,K 883 Test method no -10mA IC 2 ...

Page 40

TABLE III. Group A inspection for device types 01 and 03 – Continued. Terminal conditions: (Outputs not designated are open or resistive coupled to GND or voltage. Subgroup Symbol MIL- Cases STD- J,K 883 ...

Page 41

Outputs not designated are open or resistive coupled to GND or voltage. Terminal conditions: Inputs not designated are high ≥ 2 ≤ 0.8 V. Subgroup Symbol MIL- Case STD- 3 883 Cases 1 ...

Page 42

TABLE III. Group A inspection for device types 02 and 04 – Continued. Outputs not designated are open or resistive coupled to GND or voltage. Terminal conditions: Inputs not designated are high ≥ 2 ≤ 0.8 V. Subgroup ...

Page 43

Outputs not designated are open or resistive coupled to GND or voltage. Terminal conditions: Inputs not designated are high ≥ 2 ≤ 0.8 V. Subgroup Symbol MIL- Case STD- Test no ...

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TABLE III. Group A inspection for device type 05 – Continued. Outputs not designated are open or resistive coupled to GND or voltage. Terminal conditions: Inputs not designated are high ≥ 2 ≤ 0.8 V. Subgroup Symbol MIL- ...

Page 45

For unprogrammed devices, apply 13 pin 1(A7) and pin 2 (A6), for device types 01 and 02, and on pin 1 (A8) for device type 05 for circuit A devices. 2/ For programmed devices, select an appropriate ...

Page 46

For unprogrammed devices, apply pin 4 (A4), apply V circuit H. 14/ For unprogrammed devices, apply 10 pin 1 (A7) for circuit B devices.. 15/ For unprogrammed devices, apply 10 pin 3 ...

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TABLE IVA. Programming characteristics for circuit A. Parameter Symbol Address input voltage Programming V PH Voltage to V low Program verify V PHV Verify voltage V R Programming input low I ILP ...

Page 48

TABLE IVB. Programming characteristics for circuit B. Parameter Symbol V required during V CC CCP programming VOUT current limit I OP during programming Output programming V OUT voltage Pulse width programming voltage Programming delay ...

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TABLE IVC. Programming characteristics for circuit C, device types 02 and 04. Parameter Symbol Programming voltage to V CCP V CC Verificaiton upper limit V CCH Verificaiton lower limit V CCL Verify threshold V S Programming supply I CCP current ...

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TABLE IVC. Programming characteristics for circuit C, device type 05 – Continued. Parameter Symbol Programming voltage to V CCP Verify voltage V CCV Input voltage, high level V IH “1” Input voltage, low level V IL “0” ...

Page 51

TABLE IVD. Programming characteristics for circuit D. Parameter Symbol Power supply voltage V CC Power supply rise time t r(VCC) 2/ Power supply fall time t f(VCC time off time 4/ t ...

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TABLE IVD. Programming characteristics for circuit D – Continued. Parameter Symbol Programming current I OPLP linear point Output programming I OP(MAX) current limits Output programming V OP(MAX) voltage limit Current slew rate SR IOP Blow sense voltage V PS Delay ...

Page 53

TABLE IVF. Programming characteristics for circuit F . Parameter Symbol V required during V CC CCP programming Rise time of program t TLH pulse to data out or program pin Programming voltage program pin Output programming V ...

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TABLE IVG. Programming characteristics for circuit G . Parameter Symbol Required V for V CC CCP programming I during programming I CC CCP Required output voltage V OP for programming Output current while I OP programming Rate of voltage change ...

Page 55

TABLE IVH. Programming characteristics for circuit H . Parameters Steady-state supply voltage Input voltage Voltage all outputs except the one to be programmed Supply voltage level to program a bit Select or enable level to program a bit Output level ...

Page 56

TABLE IVI. Programming characteristics for circuit I . Parameter Symbol V during programming V CC CCP High level input voltage V IHP during programming Low level input voltage V ILP during programming Chip enable voltage V CEP during programming Output ...

Page 57

TABLE IVJ. Programming characteristics for circuit J . Parameters Address input voltage 2/ Programming/verify voltage Programming voltage current limit with V Voltage rise and fall time Programming delay Programming pulse width Programming duty cycle Output voltage enable ...

Page 58

PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel performed by DoD or in-house contractor personnel, these personnel need to ...

Page 59

Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M- 38510 in this document have been replaced by appropriate references to MIL-PRF-38535. ...

Page 60

Change from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians: Army - CR Navy - EC Air Force - 11 ...

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