LCMXO1200C-3BN256I Lattice, LCMXO1200C-3BN256I Datasheet - Page 45

• Manufacturer Part Number: LCMXO1200C-3BN256I
• Description: IC PLD 1200LUTS 211I/O 256CABGA
• Manufacturer: Lattice

Specifications of LCMXO1200C-3BN256I

• Programmable Type: *
• Number Of Macrocells: *
• Voltage - Input: *
• Speed: *
• Mounting Type: *
• Package / Case: *
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 220-1063

Lattice Semiconductor
Switching Test Conditions
Figure 3-6 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Figure 3-5.
Figure 3-6. Output Test Load, LVTTL and LVCMOS Standards
Table 3-5. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and LVCMOS settings (L -> H, H -> L)
LVTTL and LVCMOS 3.3 (Z -> H)
LVTTL and LVCMOS 3.3 (Z -> L)
Other LVCMOS (Z -> H)
Other LVCMOS (Z -> L)
LVTTL + LVCMOS (H -> Z)
LVTTL + LVCMOS (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
DUT
V
R1
T
3-19
188
R

1
CL
0pF
0pF
C
L
Test Poi nt
DC and Switching Characteristics
LVTTL, LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
1.5
V
V
V
V
OH
OL
CCIO
CCIO
- 0.15
- 0.15
/2
/2
MachXO Family Data Sheet
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
V
V
V
V
V
—
—
—
—
—
OH
OH
OH
OL
OL
OL
T