CAT5112VI-10-T3 | |
|---|---|
| Manufacturer Part Number | CAT5112VI-10-T3 |
| Description | IC POT DIGITL 10K 32TAP 8SOIC |
| Manufacturer | ON Semiconductor |
| CAT5112VI-10-T3 datasheets |
|
Availability: By request
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Warranty: 60 days
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Specifications of CAT5112VI-10-T3 | |||
|---|---|---|---|
| Taps | 32 | Resistance (ohms) | 10K |
| Number Of Circuits | 1 | Temperature Coefficient | 300 ppm/°C Typical |
| Memory Type | Non-Volatile | Interface | Up/Down |
| Voltage - Supply | 2.5 V ~ 6 V | Operating Temperature | -40°C ~ 85°C |
| Mounting Type | Surface Mount | Package / Case | 8-SOIC (3.9mm Width) |
| Resistance In Ohms | 10K | Lead Free Status / RoHS Status | Lead free / RoHS Compliant |
| Other names | CAT5112VI-10-T3CT CAT5112VI-10-TE13CT CAT5112VI-10-TE13CT | ||
PrevNext
Table 1. OPERATION MODES
INC
CS
U/D
High to Low
Low
High
High to Low
Low
Low
High
Low to High
Low
Low to High
X
High
Table 2. ABSOLUTE MAXIMUM RATINGS
Parameters
Supply Voltage
V
to GND
CC
Inputs
CS to GND
INC to GND
U/D to GND
R
to GND
H
R
to GND
L
R
to GND
WB
Operating Ambient Temperature
Commercial (‘C’ or Blank suffix)
Industrial (‘I’ suffix)
Junction Temperature
Storage Temperature
Lead Soldering (10 s max)
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 3. RELIABILITY CHARACTERISTICS
Symbol
Parameter
V
(Note 1)
ESD Susceptibility
ZAP
I
(Notes 1, 2)
Latch−Up
LTH
T
Data Retention
DR
N
Endurance
END
1. This parameter is tested initially and after a design or process change that affects the parameter.
2. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to V
Operation
Wiper toward R
H
Wiper toward R
L
X
Store Wiper Position
X
No Store, Return to Standby
X
Standby
R
H
C
H
R
WI
C
W
C
L
R
L
Figure 3. Potentiometer Equivalent Circuit
Test Method
MIL−STD−883, Test Method 3015
JEDEC Standard 17
MIL−STD−883, Test Method 1008
MIL−STD−883, Test Method 1003
http://onsemi.com
4
R
WB
Ratings
Units
−0.5 to +7
−0.5 to V
+0.5
CC
−0.5 to V
+0.5
CC
−0.5 to V
+0.5
CC
−0.5 to V
+0.5
CC
−0.5 to V
+0.5
CC
−0.5 to V
+0.5
CC
0 to 70
−40 to +85
+150
−65 to +150
+300
Min
Typ
Max
2000
100
100
1,000,000
+ 1 V
CC
V
V
V
V
V
V
V
°C
°C
°C
°C
°C
Units
V
mA
Years
Stores
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