3-1761607-3 TE Connectivity, 3-1761607-3 Datasheet
3-1761607-3
Specifications of 3-1761607-3
Related parts for 3-1761607-3
3-1761607-3 Summary of contents
Page 1
... Successful qualification testing on the subject product line was com pleted on 03Nov95, additional testing was com pleted on 23Feb10. The Qualification Test Report num ber for this testing is 501-325. This docum entation is on file at and available from Engineering Practices and Standards (EPS). ...
Page 2
... TE Spec 109-202, Condition A. 240°C for specim ens with tin-lead plated soldertails. TE Spec 109-202, Condition B. 265°C for specim ens with lead-free tin plated soldertails. EIA-364-29, Method A. Apply axial load of 2 pounds to contacts and hold for 6 seconds. See Figure ...
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... Figure 2 108-40018 Procedure EIA-364-32, Test Condition II. Subject unm ated specim ens to 5 cycles between -65 and 105°C with 30 m inute dwells at tem perature extrem es. EIA-364-31, Method III. Subject unm ated specim ens to 10 cycles (10 days) between 25 and 65° 100% RH with cold shock ...
Page 4
... If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process, product assurance shall coordinate requalification testing, consisting of all or part of the original testing sequence as determ ined by developm ent/product, quality and reliability engineering. 4.3. Acceptance Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product ...
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... AMP-LATCH Universal Header IDC Standard Profile Header Rev F AMP-LATCH Low Profile Header IDC Low Profile Header Figure 3 Contact Retention 108-40018 ...