IC MAX 7000 CPLD 64 44-PLCC

EPM7064SLI44-7N

Manufacturer Part NumberEPM7064SLI44-7N
DescriptionIC MAX 7000 CPLD 64 44-PLCC
ManufacturerAltera
SeriesMAX® 7000
EPM7064SLI44-7N datasheet
 

Specifications of EPM7064SLI44-7N

Programmable TypeIn System ProgrammableDelay Time Tpd(1) Max7.5ns
Voltage Supply - Internal4.5 V ~ 5.5 VNumber Of Logic Elements/blocks4
Number Of Macrocells64Number Of Gates1250
Number Of I /o36Operating Temperature-40°C ~ 85°C
Mounting TypeSurface MountPackage / Case44-PLCC
Voltage5VMemory TypeEEPROM
Number Of Logic Elements/cells4Lead Free Status / RoHS StatusLead free / RoHS Compliant
Features-Other names544-2017
EPM7064SLI44-7N
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Design Security
All MAX 7000 devices contain a programmable security bit that controls
access to the data programmed into the device. When this bit is
programmed, a proprietary design implemented in the device cannot be
copied or retrieved. This feature provides a high level of design security
because programmed data within EEPROM cells is invisible. The security
bit that controls this function, as well as all other programmed data, is
reset only when the device is reprogrammed.
Generic Testing
Each MAX 7000 device is functionally tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100%
programming yield. AC test measurements are taken under conditions
equivalent to those shown in
erased during early stages of the production flow.
Figure 10. MAX 7000 AC Test Conditions
QFP Carrier &
MAX 7000 and MAX 7000E devices in QFP packages with 100 or more
pins are shipped in special plastic carriers to protect the QFP leads. The
Development
carrier is used with a prototype development socket and special
programming hardware available from Altera. This carrier technology
Socket
makes it possible to program, test, erase, and reprogram a device without
exposing the leads to mechanical stress.
f
For detailed information and carrier dimensions, refer to the
& Development Socket Data
1
Altera Corporation
MAX 7000 Programmable Logic Device Family Data Sheet
Figure
Power supply transients can affect AC
measurements. Simultaneous
transitions of multiple outputs should be
avoided for accurate measurement.
Threshold tests must not be performed
under AC conditions. Large-amplitude,
fast ground-current transients normally
occur as the device outputs discharge
the load capacitances. When these
transients flow through the parasitic
inductance between the device ground
pin and the test system ground,
significant reductions in observable
noise immunity can result. Numbers in
brackets are for 2.5-V devices and
outputs. Numbers without brackets are
for 3.3-V devices and outputs.
Sheet.
MAX 7000S devices are not shipped in carriers.
10. Test patterns can be used and then
464 Ω
[703 Ω]
Device
Output
Ω
250
C1 (includes JIG
[8.06
]
capacitance)
Device input
rise and fall
times < 3 ns
QFP Carrier
VCC
To Test
System
25