IC FLEX 10K FPGA 30K 208-RQFP

EPF10K30RI208-4

Manufacturer Part NumberEPF10K30RI208-4
DescriptionIC FLEX 10K FPGA 30K 208-RQFP
ManufacturerAltera
SeriesFLEX-10K®
EPF10K30RI208-4 datasheet
 


Specifications of EPF10K30RI208-4

Number Of Logic Elements/cells1728Number Of Labs/clbs216
Total Ram Bits12288Number Of I /o147
Number Of Gates69000Voltage - Supply4.5 V ~ 5.5 V
Mounting TypeSurface MountOperating Temperature-40°C ~ 100°C
Package / Case208-RQFPLead Free Status / RoHS StatusContains lead / RoHS non-compliant
Other names544-2233  
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FLEX 10K Embedded Programmable Logic Device Family Data Sheet
Generic Testing
Operating
Conditions
Table 17. FLEX 10K 5.0-V Device Absolute Maximum Ratings
Symbol
Parameter
V
Supply voltage
CC
V
DC input voltage
I
I
DC output current, per pin
OUT
T
Storage temperature
STG
T
Ambient temperature
AMB
T
Junction temperature
J
44
Each FLEX 10K device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100% yield.
AC test measurements for FLEX 10K devices are made under conditions
equivalent to those shown in
to configure devices during all stages of the production flow.
Figure 19. FLEX 10K AC Test Conditions
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients flow through the
parasitic inductance between the device
ground pin and the test system ground,
significant reductions in observable noise
immunity can result. Numbers without
parentheses are for 5.0-V devices or outputs.
Numbers in parentheses are for 3.3-V devices
or outputs. Numbers in brackets are for
2.5-V devices or outputs.
Tables 17
through
21
provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 5.0-V FLEX 10K devices.
Conditions
With respect to ground
No bias
Under bias
Ceramic packages, under bias
PQFP, TQFP, RQFP, and BGA
packages, under bias
Figure
19. Multiple test patterns can be used
464
(703 )
[521 ]
Device
Output
250
(8.06 k )
[481
Device input
rise and fall
times < 3 ns
Note (1)
Min
(2)
–2.0
–2.0
–25
–65
–65
Altera Corporation
VCC
To Test
System
C1 (includes
JIG capacitance)
Max
Unit
7.0
V
7.0
V
25
mA
150
° C
135
° C
150
° C
135
° C