IC DRIVER DARL 7CH 50V.5A 16-SOL

ULN2004AFWG(5,M)

Manufacturer Part NumberULN2004AFWG(5,M)
DescriptionIC DRIVER DARL 7CH 50V.5A 16-SOL
ManufacturerToshiba
TypeDarlington Array
ULN2004AFWG(5,M) datasheet
 


Specifications of ULN2004AFWG(5,M)

Number Of Drivers/receivers7/0Mounting TypeSurface Mount
Package / Case16-SOLLead Free Status / RoHS StatusLead free / RoHS Compliant
Voltage - Supply-Protocol-
Other namesULN2004AFWD(5,M)
ULN2004AFWG
ULN2004AFWG(O,M)
  
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TOSHIBA Bipolar Digital Integrated Circuit Silicon Monolithic
ULN2003APG,ULN2003AFWG,ULN2004APG,ULN2004AFWG
(Manufactured by Toshiba Malaysia)
7ch Darlington Sink Driver
The ULN2003APG/AFWG Series are high−voltage, high−current
darlington drivers comprised of seven NPN darlington pairs.
All units feature integral clamp diodes for switching inductive
loads.
Applications include relay, hammer, lamp and display (LED)
drivers.
The suffix (G) appended to the part number represents a Lead
(Pb)-Free product.
Features
Output current (single output): 500 mA max
High sustaining voltage output: 50 V min
Output clamp diodes
Inputs compatible with various types of logic
Package Type-APG: DIP-16pin
Package Type-AFWG: SOL-16pin
Input Base
Type
Resistor
ULN2003APG/AFWG
2.7 kΩ
ULN2004APG/AFWG
10.5 kΩ
Pin Connection
(top view)
ULN2003,04APG/AFWG
ULN2003APG
ULN2004APG
ULN2003AFWG
ULN2004AFWG
Weight
DIP16−P-300-2.54A : 1.11 g (typ.)
Designation
SOL16−P-150-1.27A : 0.15 g (typ.)
TTL, 5 V CMOS
6~15 V PMOS, CMOS
1
2006-06-14

ULN2004AFWG(5,M) Summary of contents

  • Page 1

    ... TOSHIBA Bipolar Digital Integrated Circuit Silicon Monolithic ULN2003APG,ULN2003AFWG,ULN2004APG,ULN2004AFWG (Manufactured by Toshiba Malaysia) 7ch Darlington Sink Driver The ULN2003APG/AFWG Series are high−voltage, high−current darlington drivers comprised of seven NPN darlington pairs. All units feature integral clamp diodes for switching inductive loads. Applications include relay, hammer, lamp and display (LED) drivers ...

  • Page 2

    Schematics (each driver) ULN2003APG/AFWG Note: The input and output parasitic diodes cannot be used as clamp diodes. Absolute Maximum Ratings Characteristic Output sustaining voltage Output current Input voltage Clamp diode reverse voltage Clamp diode forward current APG Power dissipation AFWG ...

  • Page 3

    Recommended Operating Conditions Characteristic Output sustaining voltage APG Output current AFWG Input voltage ULN2003A Input voltage (output on) ULN2004A ULN2003A Input voltage (output off) ULN2004A Clamp diode reverse voltage Clamp diode forward current APG Power dissipation AFWG Note: On PCB ...

  • Page 4

    Electrical Characteristics Characteristic Output leakage current Collector−emitter saturation voltage DC Current transfer ratio ULN2003A Input current (output on) ULN2004A Input current (output off) ULN2003A Input voltage (output on) ULN2004A Clamp diode reverse current Clamp ...

  • Page 5

    Test Circuit CEX (OFF ULN2003,04APG/AFWG (sat (ON (ON 2006-06-14 ...

  • Page 6

    ON OFF Note 1: Pulse width 50 µs, duty cycle 10% Output impedance 50 Ω Note 2: See below Input Condition Type Number ULN2003A ULN2004A Note 3: C includes probe and jig capacitance. L ...

  • Page 7

    ULN2003,04APG/AFWG 7 2006-06-14 ...

  • Page 8

    P – 2.00 (1) Type-APG free air 1.75 (2) Type-AFWG on PCB (Test Board: JEDEC 2s2p) (1) 1.50 (2) 1.25 1.00 0.75 0.50 0. 100 125 Ambient temperature Ta (°C) ULN2003,04APG/AFWG 150 8 ...

  • Page 9

    Package Dimensions Weight: 1.11 g (typ.) ULN2003,04APG/AFWG 9 2006-06-14 ...

  • Page 10

    Package Dimensions Weight: 0.15 g (typ.) ULN2003,04APG/AFWG 10 2006-06-14 ...

  • Page 11

    Notes on Contents 1. Equivalent Circuits The equivalent circuit diagrams may be simplified or some parts of them may be omitted for explanatory purposes. 2. Test Circuits Components in the test circuits are used only to obtain and confirm the ...

  • Page 12

    Points to Remember on Handling of ICs (1) Heat Radiation Design In using an IC with large current flow such as power amp, regulator or driver, please design the device so that heat is appropriately radiated, not to exceed the ...

  • Page 13

    ... TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property ...