JM38510/19007BEA Intersil, JM38510/19007BEA Datasheet - Page 36

• Manufacturer Part Number: JM38510/19007BEA
• Description: Analog Multiplexer Single 8:1 16-Pin CDIP
• Manufacturer: Intersil
• Type: Analog Multiplexerr

Specifications of JM38510/19007BEA

• Package: 16CDIP
• Maximum On Resistance: 300@±15V Ohm
• Maximum Propagation Delay Bus To Bus: 500@±15V ns
• Maximum High Level Output Current: 20 mA
• Multiplexer Architecture: 8:1
• Power Supply Type: Single|Dual

DSCC FORM 2234
APR 97
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
a.
b.
a.
b.
c.
d.
a.
b.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
(2) T
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Burn-in test, method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
Tests shall be as specified in table II herein.
Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 capacitance measurements shall be measured only for the initial test and after process or design changes
which may affect capacitance.
Subgroups 7 shall include verification of the truth table.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
A
MICROCIRCUIT DRAWING
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
= +125°C, minimum.
A
= +125°C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
F
SHEET
5962-85131
36