CY7C25702KV18-550BZXI Cypress Semiconductor Corp, CY7C25702KV18-550BZXI Datasheet

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CY7C25702KV18-550BZXI

Manufacturer Part Number
CY7C25702KV18-550BZXI
Description
IC SRAM DDR-II+ CIO-ODT 165FBGA
Manufacturer
Cypress Semiconductor Corp
Datasheet

Specifications of CY7C25702KV18-550BZXI

Lead Free Status / Rohs Status
Lead free / RoHS Compliant

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Part Number
Manufacturer
Quantity
Price
Part Number:
CY7C25702KV18-550BZXI
Manufacturer:
Cypress Semiconductor Corp
Quantity:
10 000
Part Number:
CY7C25702KV18-550BZXI
Manufacturer:
CYPRESS/赛普拉斯
Quantity:
20 000
72-Mbit DDR II+ SRAM 2-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
Features
Table 1. Selection Guide
Note
Cypress Semiconductor Corporation
Document Number: 001-66483 Rev. **
Maximum Operating Frequency
Maximum Operating Current
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V
72-Mbit density (8M x 8, 8M x 9, 4M x 18, 2M x 36)
550 MHz clock for high bandwidth
2-word burst for reducing address bus frequency
Double data rate (DDR) interfaces
(data transferred at 1100 MHz) at 550 MHz
Available in 2.5 clock cycle latency
Two input clocks (K and K) for precise DDR timing
Echo Clocks (CQ and CQ) simplify data capture in high speed
systems
Data valid pin (QVLD) to indicate valid data on the output
On-die termination (ODT) feature
Synchronous internally self-timed writes
DDR II+ operates with 2.5 cycle read latency when DOFF is
asserted HIGH
Operates similar to DDR I Device with 1 cycle read latency
when DOFF is asserted LOW
Core V
HSTL inputs and variable drive HSTL output buffers
Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)
Offered in both Pb-free and non Pb-free packages
JTAG 1149.1 compatible test access port
Phase-locked loop (PLL) for accurate data placement
SRAM uses rising edges only
Supported for D
Supports both 1.5V and 1.8V I/O supply
DD
= 1.8V ± 0.1V; I/O V
[x:0]
Description
, BWS
[x:0]
DDQ
, and K/K inputs
= 1.4V to V
72-Mbit DDR II+ SRAM 2-Word Burst Architecture
198 Champion Court
DD
[1]
x18
x36
x8
x9
550 MHz
550
740
740
760
970
Configurations
With Read Cycle Latency of 2.5 cycles:
CY7C25662KV18 – 8M x 8
CY7C25772KV18 – 8M x 9
CY7C25682KV18 – 4M x 18
CY7C25702KV18 – 2M x 36
Functional Description
The CY7C25662KV18, CY7C25772KV18, CY7C25682KV18,
and CY7C25702KV18 are 1.8V Synchronous Pipelined SRAMs
equipped with DDR II+ architecture. The DDR II+ consists of an
SRAM core with advanced synchronous peripheral circuitry.
Addresses for read and write are latched on alternate rising
edges of the input (K) clock. Write data is registered on the rising
edges of both K and K. Read data is driven on the rising edges
of K and K. Each address location is associated with two 8-bit
words (CY7C25662KV18), 9-bit words (CY7C25772KV18),
18-bit
(CY7C25702KV18) that burst sequentially into or out of the
device.
These devices have an On-Die Termination feature supported
for D
external termination resistors, reduce cost, reduce board area,
and simplify board routing.
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs D) are tightly matched to the two
output echo clocks CQ/CQ, eliminating the need for separately
capturing data from each individual DDR SRAM in the system
design.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the K or K input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
(2.5 Cycle Read Latency) with ODT
CY7C25662KV18, CY7C25772KV18
CY7C25682KV18, CY7C25702KV18
[x:0]
DDQ
500 MHz
, BWS
words
= 1.4V to V
500
690
690
700
890
San Jose
[x:0]
(CY7C25682KV18),
DD
, and K/K inputs, which helps eliminate
,
.
CA 95134-1709
450 MHz
450
630
630
650
820
Revised March 15, 2011
400 MHz
400
580
580
590
750
or
36-bit
408-943-2600
MHz
Unit
mA
words
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