71V3579S85BG IDT, Integrated Device Technology Inc, 71V3579S85BG Datasheet - Page 9

• Manufacturer Part Number: 71V3579S85BG
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of 71V3579S85BG

• Density: 4.5Mb
• Access Time (max): 8.5ns
• Sync/async: Synchronous
• Architecture: SDR
• Clock Freq (max): 87MHz
• Operating Supply Voltage (typ): 3.3V
• Address Bus: 18b
• Package Type: BGA
• Operating Temp Range: 0C to 70C
• Number Of Ports: 1
• Supply Current: 180mA
• Operating Supply Voltage (min): 3.135V
• Operating Supply Voltage (max): 3.465V
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 119
• Word Size: 18b
• Number Of Words: 256K
• Lead Free Status / Rohs Status: Not Compliant

NOTE:
1. The LBO pin will be internally pulled to V
NOTES:
1. All values are maximum guaranteed values.
2. At f = f
3. For I/Os V
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
Symbol
IDT71V3577, IDT71V3579, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Flow-Through Outputs, Burst Counter, Single Cycle Deselect
I
I
Symbol
I
SB2
SB1
I
DD
ZZ
V
V
|I
|I
|I
LO
LI
LI
OL
OH
|
|
|
MAX,
Operating Power Supply Current
CMOS Standby Power
Supply Current
Clock Running Power
Supply Current
Full Sleep Mode Supply Current
HD
inputs are cycling at the maximum frequency of read cycles of 1/t
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
ZZ and LBO Input Leakage Current
= V
DDQ
Parameter
- 0.2V, V
LD
= 0.2V. For other inputs V
Parameter
DD
if it is not actively driven in the application and the ZZ in will be internally pulled to V
Device Se lected, Outputs Open, V
Device Deselected, Outputs Open, V
Device Deselected, Outputs Open, V
V
V
V
ZZ > V
(1)
DDQ
DDQ
DDQ
= Max., V
= Max., V
= Max., V
See Figure 1
HD,
0 to 3V
1.5V
1.5V
V
2ns
HD
DD
= V
= Max.
IN
IN
IN
Test Conditions
DD
> V
> V
> V
5280 tbl 10
- 0.2V, V
IH
HD
HD
I
I
V
V
V
OL
OH
or < V
DD
DD
OUT
or < V
or < V
= +8mA, V
6.42
= -8mA, V
= Max., V
= Max., V
CYC
= 0V to V
9
LD
IL
LD
LD
, f = f
(Typical, ns)
while ADSC = LOW; f=0 means no input lines are changing.
= 0.2V.
, f = 0
, f = f
DD
DD
DD
IN
IN
MAX
DD
DD
DDQ
tCD
MAX
= Max.,
= 0V to V
= 0V to V
= Min.
(2,3)
= Min.
(2)
= Max.,
= Max.,
, Device Deselected
Test Conditions
Figure 2. Lumped Capacitive Load, Typical Derating
(2,.3)
6
5
4
3
2
1
DD
DD
Commercial and Industrial Temperature Ranges
Com'l Only
20 30 50
7.5ns
255
30
90
30
I/O
Com'l
200
Capacitance (pF)
30
85
30
Figure 1. AC Test Load
80
8ns
Z
0
100
= 50
210
Ind
35
95
35
SS
Min.
2.4
___
___
___
___
if not actively driven.
Com'l
180
30
80
30
50
8.5ns
Max.
0.4
V
30
___
5
5
DDQ
Ind
190
35
90
35
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/2
Unit
µ A
µ A
µ A
Unit
V
V
mA
mA
mA
mA
200
,
,