MG100Q2YL1 TOSHIBA Semiconductor CORPORATION, MG100Q2YL1 Datasheet

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MG100Q2YL1

Manufacturer Part Number
MG100Q2YL1
Description
Manufacturer
TOSHIBA Semiconductor CORPORATION
Datasheet
High Power & High Speed Switching
Applications
·
·
·
Equivalent Circuit
Maximum Ratings
High input impedance
Enhancement-mode
The electrodes are isolated from case.
Collector-emitter voltage
Gate-emitter voltage
Collector current
Forward current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
Isolation voltage
Screw torque
C1
Characteristics
G1 E1/C2
Mounting
(Ta = = = = 25°C)
Terminal
E1
1 ms
1 ms
DC
DC
TOSHIBA IGBT Module Silicon N Channel IGBT
MG100Q2YS65H
G2
E2
Symbol
V
V
V
T
I
I
GES
P
CES
I
CP
FM
¾
¾
I
T
Isol
stg
C
F
C
j
E2
(AC 1 minute)
-40 to 125
Rating
1200
2500
±20
100
200
100
200
690
150
3
3
1
Weight: 255 g (typ.)
JEDEC
JEITA
TOSHIBA
N▪m
Unit
°C
°C
W
V
V
A
A
V
2-95A4A
MG100Q2YS65H
2002-10-04
Unit: mm

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MG100Q2YL1 Summary of contents

Page 1

TOSHIBA IGBT Module Silicon N Channel IGBT MG100Q2YS65H High Power & High Speed Switching Applications High input impedance · · Enhancement-mode · The electrodes are isolated from case. Equivalent Circuit E1/C2 ( 25°C) ...

Page 2

Electrical Characteristics Characteristics Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Turn-on delay time Rise time Turn-on time Switching time Turn-off delay time Fall time Turn-off time Forward voltage Reverse recovery time Thermal resistance ...

Page 3

I – (sat) 200 150 10 V 100 690 Common emitter Tc = 25° ...

Page 4

Switching time – Common emitter : Tc = 25° 600 125° ± (on) 0.01 ...

Page 5

– 1600 Common emitter 25°C 1200 800 200 V 600 V 400 V 400 0 0 200 400 600 Charge Q (nC) ...

Page 6

RESTRICTIONS ON PRODUCT USE · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress ...

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