STM32F103T8

Manufacturer Part NumberSTM32F103T8
DescriptionMainstream Performance line, ARM Cortex-M3 MCU with 64 Kbytes Flash, 72 MHz CPU, motor control, USB and CAN
ManufacturerSTMicroelectronics
STM32F103T8 datasheet
 

Specifications of STM32F103T8

Conversion Range0 to 3.6 VPeripherals Supportedtimers, ADC, SPIs, I2Cs and USARTs
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STM32F103x8, STM32F103xB
Table 30.
EMS characteristics
Symbol
Voltage limits to be applied on any I/O pin to
V
FESD
induce a functional disturbance
Fast transient voltage burst limits to be
V
applied through 100 pF on V
EFTB
pins to induce a functional disturbance
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 31.
EMI characteristics
Symbol Parameter
S
Peak level
EMI
Parameter
V
f
HCLK
conforms to IEC 61000-4-2
V
and V
f
DD
SS
HCLK
conforms to IEC 61000-4-4
Monitored
Conditions
frequency band
0.1 to 30 MHz
= 3.3 V, T
= 25 °C,
V
DD
A
30 to 130 MHz
LQFP100 package
compliant with
130 MHz to 1GHz
IEC 61967-2
SAE EMI Level
Doc ID 13587 Rev 13
Electrical characteristics
Conditions
= 3.3 V, T
= +25 °C,
DD
A
= 72 MHz
= 3.3 V, T
= +25 °C,
DD
A
= 72 MHz
Max vs. [f
/f
HSE
HCLK
8/48 MHz 8/72 MHz
12
12
22
19
23
29
4
4
Level/
Class
2B
4A
]
Unit
dBµV
-
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