IC BUFF DL UHS O/DRAIN 6MICROPAK

NC7WZ07L6X

Manufacturer Part NumberNC7WZ07L6X
DescriptionIC BUFF DL UHS O/DRAIN 6MICROPAK
ManufacturerFairchild Semiconductor
Series7WZ
NC7WZ07L6X datasheet
Product Change Notification
 


Specifications of NC7WZ07L6X

Logic TypeBuffer/Line Driver, Non-Inverting with Open DrainNumber Of Elements2
Number Of Bits Per Element2Voltage - Supply1.65 V ~ 5.5 V
Operating Temperature-40°C ~ 85°CMounting TypeSurface Mount
Package / Case6-MicroPak™Logic FamilyNC7WZ
Number Of Channels Per ChipDualPolarityNon-Inverting
Supply Voltage (max)5.5 VSupply Voltage (min)1.65 V
Maximum Operating Temperature85 CMounting StyleSMD/SMT
Input Bias Current (max)1 uALow Level Output Current32 mA
Maximum Power Dissipation180 mWMinimum Operating Temperature- 40 C
Output TypeOpen DrainNumber Of Lines (input / Output)2 / 2
Propagation Delay Time11.5 ns at 1.65 V, 9.5 ns at 1.8 V, 5.8 ns at 2.5 V, 4.4 ns at 3.3 V, 3.5 ns at 5 VLead Free Status / RoHS StatusLead free / RoHS Compliant
Current - Output High, Low-  
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package assembled at Hana-Ayutthaya.
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Results/Discussion for Qual Plan Number - Q20070331
Test: (Autoclave) | Conditions: 100%RH, 121C | Standard: JESD22-A102
Lot
Device
Q20070331AAACLVB
FSA2257L10X
Q20070331BAACLVB
NC7SZ125L6X
Q20070331CAACLVB
FHP3131IL6X
Q20070331DAACLVB
NC7SZ74L8X
Test: (C Scanning Acoustical Microscope) | Conditions: | Standard:
Lot
Device
Q20070331AACSAM1B
FSA2257L10X
Q20070331AACSAM2B
Q20070331BACSAM1B
NC7SZ125L6X
Q20070331BACSAM2B
Q20070331CACSAM1B
FHP3131IL6X
Q20070331CACSAM2B
Q20070331DACSAM1B
NC7SZ74L8X
Q20070331DACSAM2B
Test: (Construction Analysis) | Conditions: | Standard:
Lot
Device
Q20070331AACONSTB
FSA2257L10X
Q20070331BACONSTB
NC7SZ125L6X
Q20070331CACONSTB
FHP3131IL6X
Q20070331DACONSTB
NC7SZ74L8X
Test: (Flammability Certificate (3)) | Conditions: | Standard: UL94-0
Lot
Device
Q20070331AAFLAMB
FSA2257L10X
Q20070331BAFLAMB
NC7SZ125L6X
Q20070331CAFLAMB
FHP3131IL6X
Q20070331DAFLAMB
NC7SZ74L8X
Test: (High Temperature Storage Life) | Conditions: 150C | Standard: JESD22-A103
Lot
Device
Q20070331AAHTSLB
FSA2257L10X
Q20070331BAHTSLB
NC7SZ125L6X
Q20070331CAHTSLB
FHP3131IL6X
Q20070331DAHTSLB
NC7SZ74L8X
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 110C, 0V | Standard: JESD22-A110
Lot
Device
Q20070331AAHAST2B
FSA2257L10X
Setpoint
Result
96-HOURS
0/77
96-HOURS
0/77
96-HOURS
0/77
96-HOURS
0/77
Setpoint
Result
0/10
0/10
0/10
0/10
0/10
0/10
0/10
0/10
Setpoint
Result
0/10
0/10
0/10
0/10
Setpoint
Result
0/1
0/1
0/1
0/1
Setpoint
Result
168-HOURS
0/77
1000-HOURS
0/77
168-HOURS
0/77
1000-HOURS
0/77
168-HOURS
0/77
1000-HOURS
0/77
168-HOURS
0/77
1000-HOURS
0/77
Setpoint
Result
264-HOURS
0/45
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
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