IC BUFF/DVR DUAL N-INV 20SOEIAJ

 

MC74LVX244MELG

Manufacturer Part NumberMC74LVX244MELG
DescriptionIC BUFF/DVR DUAL N-INV 20SOEIAJ
ManufacturerON Semiconductor
Series74LVX
MC74LVX244MELG datasheets

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Specifications of MC74LVX244MELG

Logic TypeBuffer/Line Driver, Non-InvertingNumber Of Elements2
Number Of Bits Per Element4Current - Output High, Low4mA, 4mA
Voltage - Supply2 V ~ 3.6 VOperating Temperature-40°C ~ 85°C
Mounting TypeSurface MountPackage / Case20-SOIC (5.3mm Width), 20-SO, 20-SOEIAJ
Logic FamilyLVXNumber Of Channels Per Chip8
PolarityNon-InvertingSupply Voltage (max)3.6 V
Supply Voltage (min)2 VMaximum Operating Temperature+ 85 C
Mounting StyleSMD/SMTHigh Level Output Current- 4 mA
Low Level Output Current4 mAMaximum Power Dissipation180 mW
Minimum Operating Temperature- 40 CNumber Of Lines (input / Output)8 / 3
Output Type3-StatePropagation Delay Time14.9 ns at 2.7 V, 10.6 ns at 3.3 V
Lead Free Status / RoHS StatusLead free / RoHS Compliant  
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1Dn, 2Dn
50%
t
PLH
1On, 2On
50% V
CC
Figure 3.
TEST POINT
OUTPUT
DEVICE
UNDER
C
TEST
L
*Includes all probe and jig capacitance
Figure 5. Propagation Delay Test Circuit
MC74LVX244
SWITCHING WAVEFORMS
V
CC
1OE, 2OE
GND
t
PHL
1On, 2On
1On, 2On
TEST CIRCUITS
DEVICE
UNDER
*
TEST
*Includes all probe and jig capacitance
Figure 6. Three−State Test Circuit
http://onsemi.com
5
V
CC
50%
GND
t
t
PZL
PLZ
HIGH
IMPEDANCE
50% V
CC
V
+0.3V
OL
t
t
PZH
PHZ
V
−0.3V
OH
50% V
CC
HIGH
IMPEDANCE
Figure 4.
TEST POINT
CONNECT TO V
WHEN
CC
1 kW
OUTPUT
TESTING t
AND t
PLZ
CONNECT TO GND WHEN
TESTING t
AND t
PHZ
C
*
L
.
PZL
.
PZH

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