MT29F8G08FABWP Micron Technology, Inc, MT29F8G08FABWP Datasheet - Page 29

• Manufacturer Part Number: MT29F8G08FABWP
• Manufacturer: Micron Technology, Inc

READ STATUS 70h
Figure 21:
09005aef818a56a7 pdf/ 09005aef81590bdd source
2gb_nand_m29b__2.fm - Rev. H 9/05 EN
WE#
I/Ox
CE#
RE#
CLE
Status Register Operation
These NAND Flash devices have an 8-bit status register that the software can read dur-
ing device operation. On the x16 device, I/O[15:8] are “0” when reading the status regis-
ter. Table 9 describes the status register.
After the READ STATUS command has been issued to the NAND Flash device, all subse-
quent READ cycles will output data from the status register until another command is
issued. Note that the RE# pin can be toggled multiple times without issuing a new READ
STATUS command, as shown in Figure 21. Each time the RE# pin is toggled, the updated
status will be output on I/O[7:0].
In addition, after a READ STATUS command has been issued to the NAND Flash device,
the status register provides continually updated output on I/O[7:0] as long as CE# and
RE# are held LOW, i.e., RE# does not have to be toggled.
Note that MT29FxGxxxAB devices do not support a READ STATUS operation in which
the READ STATUS (70h) command is repeatedly issued after each RE# toggle.
Additional details regarding READ STATUS implementation are available in technical
note TN-29-13 at: www.micron.com/products/nand/massstorage/technote.
While monitoring the read status to determine when the
data register) is complete, the user must re-issue the READ (00h) command to make the
change from STATUS to DATA. After the READ command has been re-issued, pulsing
the RE# line will output data, starting from the initial column address.
70h
t CLR
2, 4, and 8Gb x8/x16 Multiplexed NAND Flash Memory
t CLEA
t REA
29
Status
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Toggle RE# as required
t
R (transfer from Flash array to
Status
Command Definitions
©2004 Micron Technology, Inc. All rights reserved.
Status