KSH13007 SemiHow, KSH13007 Datasheet - Page 6

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KSH13007

Manufacturer Part Number
KSH13007
Description
Switch Mode Series NPN Silicon Power Transistor
Manufacturer
SemiHow
Datasheet

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Reliability Qualification
www.DataSheet4U.com
A. High Temperature Reverse Bias ( HTRB )
B. Pressure Cooker Test ( PCT )
C. Temperature Humidity Bias ( THBT )
Autoclave ( ACLV )
The addition of voltage bias accelerates the corrosive effect after moisture penetration has taken place.
with time, this is a catastrophically destructive test.
The purpose of this test is to determine the sensitivity of the product to mobile ion contamination and
The purpose of this test is to evaluate the moisture resistance of non-hermetic components under
The purpose of this test is to evaluate the moisture resistance of non-hermetic components.
Conditions: JESD22-A108, JIS C 7021 B-8
T
Conditions: JESD22-A102, JIS C 7021 A-6
T
Conditions: JESD22-A101
T
related failure mechanisms.
pressure/temperature conditions.
A
A
A
=150℃ V
=121℃ RH=100% P=1 atmosphere (15psig)
=85℃ RH=85% V
Sample Size
Sample Size
Sample Size
CB
=80% max rated V
45
45
45
CB
=80% max rated V
#of Fail
#of Fail
#of Fail
0
0
0
CB
Cum. Fail%
Cum. Fail%
Cum. Fail%
CB
0.0%
0.0%
0.0%
168hrs
168hrs
48hrs
0
0
0
300hrs
300hrs
0
0
◎ SEMIHOW REV.A0,May 2003

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