TDA1311AT Philips Semiconductors, TDA1311AT Datasheet - Page 7

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TDA1311AT

Manufacturer Part Number
TDA1311AT
Description
Stereo Continuous Calibration DAC CC-DAC
Manufacturer
Philips Semiconductors
Datasheet

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Philips Semiconductors
Note
1. Measured with 1 kHz sinewave generated at sampling rate of 192 kHz.
1995 Dec 18
Timing (see Fig.4)
t
t
t
t
t
t
t
t
t
Analog outputs; pins V
V
TC
V
(THD+N)/S total harmonic distortion plus
t
S/N
t
r
f
CY
BCKH
BCKL
SU;DAT
HD:DAT
HD:WS
SU;WS
cs
SYMBOL
d
FS
os
cs
I
Stereo Continuous Calibration DAC
(CC-DAC)
O
FS
rise time
fall time
bit clock cycle time
bit clock pulse width HIGH
bit clock pulse width LOW
data set-up time
data hold time to bit clock
word select hold time
word select set-up time
full-scale voltage
full-scale temperature
coefficient
offset voltage
noise
current settling time to 1 LSB
channel separation
unbalance between outputs
time delay between outputs
signal-to-noise ratio at
bipolar zero
PARAMETER
OL
and V
OR
V
at 0 dB signal level; note 1
at 60 dB signal level; note 1
at 60 dB signal level;
A-weighted; note 1
at 0 dB signal level; f = 20 Hz
to 20 kHz
note 1
A-weighted at code 0000H
DD
= V
CONDITIONS
OL/ORmax
7
54
15
15
12
2
2
12
1.8
0.45
75
86
MIN.
2.0
0.50
0.04
3
2
0.05
0.2
80
0.2
92
400
68
30
33
65
0.2
TYP.
Preliminary specification
12
12
2.2
0.55
0.07
6
0.09
0.3
63
24
61
MAX.
TDA1311A
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
ppm
V
dB
%
dB
%
dB
%
dB
%
dB
dB
dB
s
s
UNIT

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