DS1005 Dallas Semiconducotr, DS1005 Datasheet - Page 5

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DS1005

Manufacturer Part Number
DS1005
Description
5-Tap Silicon Delay Line
Manufacturer
Dallas Semiconducotr
Datasheet

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TEST SETUP DESCRIPTION
Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1005.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected between the input and each tap. Each
tap is selected and connected to the counter by a VHF switch control unit. All measurements are fully
automated, with each instrument controlled by a central computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature
Supply Voltage (V
Input Pulse
Source Impedance
Rise and Fall Time
Pulse Width
Period
OUTPUT:
Each output is loaded with the equivalent of a 74F04 input gate. Delay is measured at the 1.5V level on
the rising and falling edge.
NOTE:
Above conditions are for test only and do not restrict the operation of the device under other data sheet
conditions.
CC
)
25 C =3 C
5.0V =0.1V
High = 3.0V =0.1V
Low = 0.0V =0.1V
3.0 ns maximum
500 ns
1 s
50 ohm maximum
5 of 6
DS1005

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