td62105f TOSHIBA Semiconductor CORPORATION, td62105f Datasheet
td62105f
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... TOSHIBA BIPOLAR DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TD62101P,TD62101F,TD62103P,TD62103F TD62104P,TD62104F,TD62105P,TD62105F 7CH DARLINGTON SINK DRIVER The TD62101P / F series are high-voltage, high-current darlington drivers comprised of seven NPN darlington pairs. FEATURES Output current (single output) : 500 mA (max) High sustaining voltage output : 25 V (min) Inputs compatible with various types of logic. ...
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SCHEMATICS (EACH DRIVER) TD62103P / F Note: The input and output parasitic diodes cannot be used as clamp diodes. ABSOLUTE MAXIMUM RATINGS CHARACTERISTICS Output Sustaining Voltage Output Current Input Voltage Input Current P Power Dissipation F P Operating Temperature F ...
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ELECTRICAL CHARACTERISTICS CHARACTERISTIC P Output Leakage Current F Collector−Emitter Saturation Voltage DC Current Transfer Ratio TD62101P / F Output On TD62103P / F Input TD62104P / F Current TD62105P / F P Output Off F TD62103P / F TD62104P / ...
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TEST CIRCUIT (OFF OFF Note 1: Pulse Width 50 µs, Duty Cycle 10% Output Impedance 50 Ω, t ≤ Note 2: See right. Note 3: C includes probe ...
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TD62101,103~105P/F 5 2006-06-14 ...
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TD62101,103~105P/F 6 2006-06-14 ...
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PACKAGE DIMENSIONS DIP16−P−300−2.54A Weight: 1.11 g (typ.) TD62101,103~105P/F 7 Unit: mm 2006-06-14 ...
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PACKAGE DIMENSIONS SOP16−P−225−1.27 Weight: 0.16 g (typ.) TD62101,103~105P/F 8 Unit: mm 2006-06-14 ...
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Notes on Contents 1. Equivalent Circuits The equivalent circuit diagrams may be simplified or some parts of them may be omitted for explanatory purposes. 2. Test Circuits Components in the test circuits are used only to obtain and confirm the ...
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Points to Remember on Handling of ICs (1) Heat Radiation Design In using an IC with large current flow such as power amp, regulator or driver, please design the device so that heat is appropriately radiated, not to exceed the ...
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RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to ...