74abt125pw NXP Semiconductors, 74abt125pw Datasheet - Page 3

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74abt125pw

Manufacturer Part Number
74abt125pw
Description
74abt125 Quad Buffer 3-state
Manufacturer
NXP Semiconductors
Datasheet

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1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
Philips Semiconductors
LOGIC SYMBOL (IEEE/IEC)
ABSOLUTE MAXIMUM RATINGS
NOTES:
RECOMMENDED OPERATING CONDITIONS
1998 Jan 16
SYMBOL
SYMBOL
SYMBOL
Quad buffer (3-State)
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 C.
V
T
I
V
V
T
I
OUT
V
I
V
I
amb
I
OK
OUT
OH
t/ v
V
V
OL
stg
CC
IK
CC
IH
IL
I
I
DC supply voltage
DC input diode current
DC input voltage
DC output diode current
DC output voltage
DC output current
Storage temperature range
DC supply voltage
Input voltage
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
10
13
12
1
2
4
5
9
EN
PARAMETER
3
3
1
SA00027
1, 2
11
PARAMETER
PARAMETER
3
6
8
output in Off or High state
3
output in Low state
CONDITIONS
FUNCTION TABLE
H = High voltage level
L = Low voltage level
X = Don’t care
Z = High impedance ”off” state
V
V
OEn
O
I
H
L
L
< 0
< 0
INPUTS
An
H
X
L
MIN
–40
4.5
2.0
0
0
OUTPUTS
LIMITS
Yn
–0.5 to +7.0
–1.2 to +7.0
–0.5 to +5.5
H
Z
L
–65 to 150
RATING
–18
–50
128
MAX
V
–32
+85
5.5
0.8
64
10
CC
74ABT125
Product specification
UNIT
UNIT
ns/V
UNIT
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
C
C

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