tc55v16256fti TOSHIBA Semiconductor CORPORATION, tc55v16256fti Datasheet
tc55v16256fti
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tc55v16256fti Summary of contents
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... I/O12 31 I/O11 GND 30 I/O10 29 I/ A10 24 A11 23 A17 (TC55V16256FTI) TC55V16256JI/FTI-12,-15 (Weight: 1.64 g typ) (Weight: 0.45 g typ) Address Inputs CE Chip Enable Input WE Write Enable Input OE Output Enable Input Data Byte Control Inputs V Power (+3 Ground NU Not Usable (Input) 2002-01-07 1/11 ...
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... T Operating Temperature opr *: −1.5 V with a pulse width of 20%Kt min (4 ns max) RC **: V + 1.5 V with a pulse width of 20%Kt DD TC55V16256JI/FTI-12,-15 MEMORY CELL ARRAY 1,024 × 256 × 16 (4,194,304) CE SENSE AMP COLUMN DECODER COLUMN ADDRESS BUFFER A10 A11 A12 A16 −0. min (4 ns max) ...
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DC RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER V Power Supply Voltage DD V Input High Voltage IH V Input Low Voltage IL *: −1.0 V with a pulse width of 20%Kt min (4 ns max) RC **: V + 1.0 V ...
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OPERATING MODE MODE CE Read L Write L L Outputs Disable L Standby Don’t care Note: The NU pin must be left unconnected or tied to GND or a voltage level of less than 0.8 V. You ...
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AC CHARACTERISTICS ( − − − − 40° to 85°C READ CYCLE SYMBOL PARAMETER t Read Cycle Time RC t Address Access Time ACC t Chip Enable Access Time CO t Output Enable Access Time OE ...
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TIMING DIAGRAMS (See Note 2) READ CYCLE Address Hi-Z OUT t COE WE WRITE CYCLE 1 ( CONTROLLED) Address (See Note 3) OUT INDETERMINATE D IN ...
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CE WRITE CYCLE 2 ( CONTROLLED) Address Hi-Z OUT WRITE CYCLE CONTROLLED) Address Hi-Z OUT D IN ...
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Note: (1) Operating temperature (Ta) is guaranteed for transverse air flow exceeding 400 linear feet per minute. (2) WE remains HIGH for the Read Cycle. ( goes LOW coincident with or after WE goes LOW, the outputs will ...
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PACKAGE DIMENSIONS SOJ44-P-400-1.27 Weight: 1.64 g (typ) TC55V16256JI/FTI-12,-15 2002-01-07 9/11 ...
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PACKAGE DIMENSIONS Weight: 0.45 g (typ) TC55V16256JI/FTI-12,-15 2002-01-07 10/11 ...
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RESTRICTIONS ON PRODUCT USE • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress ...