tc58dvm92a1fti0 TOSHIBA Semiconductor CORPORATION, tc58dvm92a1fti0 Datasheet - Page 25

• Manufacturer Part Number: tc58dvm92a1fti0
• Description: 512-mbit 64m U 8 Bits Cmos Nand E2 Prom
• Manufacturer: TOSHIBA Semiconductor CORPORATION

RY
RY
to I/O8
CLE
CLE
ALE
I/O1
ALE
Status Read
command “71H”.
Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass/fail) of a
Program or Erase operation, and determine whether the device is in Protect mode. The device status is output
via the I/O port on the RE clock after a Status Read command “70H” or “71H” input.
The resulting information of Status Read (1) command “70H” is outlined in Table 5 below and the resulting
information of Status Read (2) command “71H” are outlined in the explanation for Multi Block Program and
Multi Block Erase toward the end of this document.
Table 5. Status output table for Status Read (1) command “70H”
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
I/O8
/
/
CE
diagram, the Status Read function can be used to determine the status of each individual device.
WE
WE
CE
RE
BY
BY
RE
I/O
The device has three Status Read commands. There are Status Read (1) command “70H” and Status Read (2)
The device automatically implements the execution and verification of the Program and Erase operations. The
An application example with multiple devices is shown in Figure 6.
N
System Design Note: If the
1
Device
CE
1
70H
1
Write Protect
Ready/Busy
Pass/Fail
Not Used
Not Used
Not Used
Not Used
Not Used
STATUS
RY
Device
CE
Figure 6. Status Read timing application example
Pass: 0
0
0
0
0
0
Ready: 1
Protect: 0
2
/
Status on Device 1
2
BY
pin signals from multiple devices are wired together as shown in the
70H
OUTPUT
Device
CE
Busy
3
3
Fail: 1
Busy: 0
Not Protected: 1
Status on Device N
valid when the device is in the Ready
state.
The Pass/Fail status on I/O1 is only
TC58DVM92A1FTI0
Device
CE
N
N
2003-07-11 25/44
CE 
Device
N  1
N
1