tc7mbl6126s TOSHIBA Semiconductor CORPORATION, tc7mbl6126s Datasheet
tc7mbl6126s
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tc7mbl6126s Summary of contents
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... The TC7MBL6125S requires the output enable ( OE ) input to be set high to place the output into the high impedance state, whereas the TC7MBL6126S requires the output enable (OE) input to be set low to place the output into high impedance. All inputs are equipped with protection circuits against static discharge ...
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... 2OE 3OE 8 Function A port = B port Disconnect TC7MBL6126S Bn An nOE (n=1,2,3,4) 2 FTG (VQON16-P-0303-0.50 GND ...
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Absolute Maximum Ratings (Note) Characteristic Power supply range Control pin input voltage Switch terminal I/O voltage Control input pin Clump diode current Switch terminal Switch I/O current Power dissipation DC V /GND current CC Storage temperature Note: Exceeding any of ...
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Electrical Characteristics DC Characteristics (Ta = −40~85°C) Parameter Symbol “H” level V Input voltage “ L ” Input leakage current (OE, S) Power off leakage current Off-state leakage current (switch off) On resistance (Note2) ...
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Characteristic (typ.) Ta=25°C ・ Vcc = 2. 0.5 TC7MBL6125S,6126SFT/FK/FTG Vcc = 3. 2.5 3 2007-10-19 ...
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AC Test Circuit Switch Output AC Waveform Output Enable OE ( (6125S) or OE(6126S)) Output (A, B) Low to Off to Low Output (A, B) High to Off to High TC7MBL6125S,6126SFT/FK/FTG Open 2 × V Parameter CC GND t pLH ...
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... DRIVE = 120Ω(output impedance of the previous IC low-level voltage = GND) CC Previous IC Measure R DRIVE = output impedance of the previous R DRIVE TC7MBL6125S TC7MBL6126S Waveform generated with the TC7MBL6125S,6126S added C I/O (Switch On) Measure Bn/ Parameter V M Figure 3 Test Circuit 7 ) – ...
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Package Dimensions Weight: 0.06 g (typ.) TC7MBL6125S,6126SFT/FK/FTG 8 2007-10-19 ...
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Package Dimensions Weight: 0.02 g (typ.) TC7MBL6125S,6126SFT/FK/FTG 9 2007-10-19 ...
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Package Dimensions Weight: 0.013 g (typ.) TC7MBL6125S,6126SFT/FK/FTG 10 2007-10-19 ...
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RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to ...